Non-periodicity of peak-to-peak distances in x-ray diffraction spectrums from perfect superlattices

被引：4

作者：

Sankowska, I. ^{[1
]}

Domagala, J. Z. ^{[1
,2
]}

Yefanov, O. M. ^{[3
,4
]}

Jasik, A. ^{[1
]}

Kubacka-Traczyk, J. ^{[1
]}

Reginski, K. ^{[1
]}

Seeck, O. H. ^{[4
]}

机构：

[1] Inst Electr Mat Technol, PL-02668 Warsaw, Poland

[2] Polish Acad Sci, Inst Phys, PL-02668 Warsaw, Poland

[3] V Lashkarev Inst Semicond Phys, UA-03680 Kiev, Ukraine

[4] Deutsch Electronen Synchrotron DESY, D-22607 Hamburg, Germany

来源：

JOURNAL OF APPLIED PHYSICS | 2013年 / 113卷 / 06期

关键词：

III-V semiconductors;

D O I：

10.1063/1.4790712

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

X-ray diffraction investigations of type II InAs/GaSb superlattice on a GaSb(001) substrate are presented. The wide range of diffraction angles (2 theta/omega scans) covering 002 and 004 reflections was examined at Petra III synchrotron. The angular region between 002 and 004 reflections was the most interesting part of the measured diffraction profile. In this region, a non-coincidence of superlattice satellite peaks belonging to these two reflections is observed. The multiple-beam dynamical diffraction approach was used for correct simulation of the observed diffraction profile. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4790712]

引用

页数：5

共 11 条

[1]

Bowen K., 1998, HIGH RESOLUTION XRAY

[2]

Chang S.L., 1984, MULTIPLE DIFFRACTION

[3]

Fewster PaulF., 2003, XRAY SCATTERING SEMI, V2nd

[4]

Holy V., 2004, HIGH RESOLUTION XRAY

[5] ORIGIN OF UNKNOWN X-RAY-DIFFRACTION PEAKS FROM INCOMMENSURATE SUPERLATTICES [J].