Analysis of lags and current collapse in field-plate AlGaN/GaN HEMTs with deep acceptors in a buffer layer

被引:7
作者
Noda, Naohiro [1 ]
Tsurumaki, Ryouhei [1 ]
Horio, Kazushige [1 ]
机构
[1] Shibaura Inst Technol, Fac Syst Engn, Minuma Ku, 307 Fukasaku, Saitama 3378570, Japan
来源
PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 13 NO 5-6 | 2016年 / 13卷 / 5-6期
关键词
GaN HEMT; deep acceptor; current collapse; field plate; ELECTRON-MOBILITY TRANSISTORS; CURRENT TRANSIENTS; GAAS-MESFETS; GAN; SIMULATION; MECHANISM; DEVICES; HFETS;
D O I
10.1002/pssc.201510156
中图分类号
O59 [应用物理学];
学科分类号
摘要
We make 2-D transient simulations of field-plate AlGaN/GaN HEMTs with a semi-insulating buffer layer, where a deep acceptor above the midgap is considered. It is studied how the deep acceptor and the field plate affect lag phenomena and current collapse. It is shown that the drain lag and current collapse could be reduced by introducing a field plate, as in a case with a deep acceptor compensated by a deep donor in the buffer layer. This reduction occurs because electron trapping by the deep acceptors is weakened by the field plate. The dependence on insulator thickness under the field plate is also studied, suggesting that there is an optimum thickness of insulator to minimize the current collapse of AlGaN/GaN HEMTs. (C) 2016 WILEY-VCH Verlag GmbH & Co.
引用
收藏
页码:341 / 344
页数:4
相关论文
共 16 条
[1]   Trapping effects in GaN and SiC microwave FETs [J].
Binari, SC ;
Klein, PB ;
Kazior, TE .
PROCEEDINGS OF THE IEEE, 2002, 90 (06) :1048-1058
[2]   Investigation of high-electric-field degradation effects in AlGaN/GaN HEMTs [J].
Faqir, Mustapha ;
Verzellesi, Giovanni ;
Meneghesso, Gaudenzio ;
Zanoni, Enrico ;
Fantini, Fausto .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2008, 55 (07) :1592-1602
[3]   2-DIMENSIONAL SIMULATION OF GAAS-MESFETS WITH DEEP ACCEPTORS IN THE SEMI-INSULATING SUBSTRATE [J].
HORIO, K ;
ASADA, K ;
YANAI, H .
SOLID-STATE ELECTRONICS, 1991, 34 (04) :335-343
[4]   Physics-based simulation of buffer-trapping effects on slow current transients and current collapse in GaN field effect transistors [J].
Horio, K ;
Yonemoto, K ;
Takayanagi, H ;
Nakano, H .
JOURNAL OF APPLIED PHYSICS, 2005, 98 (12)
[5]   Physical Mechanism of Buffer-Related Current Transients and Current Slump in AlGaN/GaN High Electron Mobility Transistors [J].
Horio, Kazushige ;
Nakajima, Atsushi .
JAPANESE JOURNAL OF APPLIED PHYSICS, 2008, 47 (05) :3428-3433
[6]   Analysis of backside-electrode and gate-field-plate effects on buffer-related current collapse in AlGaN/GaN high electron mobility transistors [J].
Horio, Kazushige ;
Onodera, Hiraku ;
Nakajima, Atsushi .
JOURNAL OF APPLIED PHYSICS, 2011, 109 (11)
[7]   Analysis of field-plate effects on buffer-related lag phenomena and current collapse in GaN MESFETs and AlGaN/GaN HEMTs [J].
Horio, Kazushige ;
Nakajima, Atsushi ;
Itagaki, Keiichi .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2009, 24 (08)
[8]   Enhancement of breakdown voltage in AlGaN/GaN high electron mobility transistors using a field plate [J].
Karmalkar, S ;
Mishra, UK .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2001, 48 (08) :1515-1521
[9]   Mechanism of current collapse removal in field-plated nitride HFETs [J].
Koudymov, A ;
Adivarahan, V ;
Yang, J ;
Simin, G ;
Khan, AA .
IEEE ELECTRON DEVICE LETTERS, 2005, 26 (10) :704-706
[10]   Surface-related drain current dispersion effects in AlGaN-GaNHEMTs [J].
Meneghesso, G ;
Verzellesi, G ;
Pierobon, R ;
Rampazzo, F ;
Chini, A ;
Mishra, UK ;
Canali, C ;
Zanoni, E .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2004, 51 (10) :1554-1561