Analysis of compressional-wave influence on thickness-shear-mode resonators in liquids

被引:45
|
作者
Lucklum, R
Schranz, S
Behling, C
Eichelbaum, F
Hauptmann, P
机构
[1] Otto-von-Guericke-Univ. Magdeburg, Inst. Prozessmesstechnik Elektron., D-39016 Magdeburg
关键词
compressional waves; thickness-shear-mode resonators;
D O I
10.1016/S0924-4247(96)01420-3
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The operation of a thickness-shear-mode (TSM) resonator contacting a finite liquid layer has been analysed to investigate the effect of compressional-wave generation. This effect is mainly related to the non-uniform shear velocity profile across the surface of a TSM device, Hydrophone measurements show two coils of longitudinal waves. Their influence on the TSM resonator response is studied with impedance analysis, varying the spacing between resonator and reflector as well as the reflecting conditions on the top side of the liquid layer. A characteristic response with a periodicity of lambda/2 is observed when the spacing of the liquid cavity or the liquid layer thickness is changed. It indicates standing longitudinal waves in the cavity. Their influence can be modelled with an additional complex impedance in the motional arm of the Butterworth-van-Dyke equivalent circuit representing an own (compressional) transmission line.
引用
收藏
页码:40 / 48
页数:9
相关论文
共 50 条
  • [1] Analytical 3D-Analysis of compressional wave excitation by thickness-shear-mode resonators
    Beigelbeck, R
    Jakoby, B
    PROCEEDINGS OF THE IEEE SENSORS 2004, VOLS 1-3, 2004, : 91 - 94
  • [2] A two-dimensional analysis of spurious compressional wave excitation by thickness-shear-mode resonators
    Beigelbeck, R
    Jakoby, B
    JOURNAL OF APPLIED PHYSICS, 2004, 95 (09) : 4989 - 4995
  • [3] A two-dimensional analysis of spurious compressional wave excitation by thickness-shear-mode resonators (vol 95, pg 4989, 2004)
    Beigelbeck, R
    Jakoby, B
    JOURNAL OF APPLIED PHYSICS, 2004, 96 (03) : 1768 - 1768
  • [4] Validation of the frequency shift of thickness-shear-mode resonators in liquids - Determination of the activation energy of viscosity
    Bund, A
    Schwitzgebel, G
    BERICHTE DER BUNSEN-GESELLSCHAFT-PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 1997, 101 (12): : 1960 - 1962
  • [5] SENSOR CONSIDERATIONS FOR THICKNESS-SHEAR MODE RESONATORS AND COMPRESSIONAL WAVE RADIATION
    SCHNEIDER, TW
    MARTIN, SJ
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1995, 209 : 74 - COLL
  • [6] INTERFACIAL PROPERTIES AND THE RESPONSE OF THE THICKNESS-SHEAR-MODE ACOUSTIC-WAVE SENSOR IN LIQUIDS
    YANG, MS
    THOMPSON, M
    DUNCANHEWITT, WC
    LANGMUIR, 1993, 9 (03) : 802 - 811
  • [7] Electrical characterisation of high-frequency thickness-shear-mode resonators by impedance analysis
    Zimmermann, B
    Lucklum, R
    Hauptmann, P
    Rabe, J
    Büttgenbach, S
    SENSORS AND ACTUATORS B-CHEMICAL, 2001, 76 (1-3) : 47 - 57
  • [8] Vibration analysis of thickness-shear-mode trapped-energy resonators excited by parallel electric field
    Ishikawa, T
    Abe, H
    Watanabe, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2001, 40 (5B): : 3643 - 3645
  • [9] COMPRESSIONAL-WAVE DATA ACQUISITION USING SHEAR-WAVE VIBRATORS
    HORVATH, P
    WANG, HY
    JUSTICE, MG
    REED, DH
    SCHOEL, RE
    GEOPHYSICS, 1984, 49 (05) : 630 - 630
  • [10] INFLUENCE OF COMPRESSIONAL WAVE GENERATION ON THICKNESS-SHEAR MODE RESONATOR RESPONSE IN A FLUID
    SCHNEIDER, TW
    MARTIN, SJ
    ANALYTICAL CHEMISTRY, 1995, 67 (18) : 3324 - 3335