GaN HEMTs Power Module Package Design and Performance Evaluation

被引:0
作者
Ho, Chung-Hsiang [1 ]
Chou, Po-Chien [1 ]
Cheng, Stone [1 ]
机构
[1] Natl Chiao Tung Univ, Dept Mech Engn, Hsinchu 300, Taiwan
来源
2013 25TH INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND ICS (ISPSD) | 2013年
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper described the electronic performance of power module packaged high-power AlGaN/GaN high electron mobility transistors (HEMTs) on silicon substrate. Sixteen GaN chips are mounted on one AlN substrate. There are three AlN substrate in one module. Each device is wire-bonded in parallel connection to increase the power rating. Both DC and pulsed current-voltage (ID-VDS) characteristics are measured for different connection and sizes of devices, at various of power densities, pulse lengths, and duty factors. We found some conditions that makes the parallel connection difference down to zero. According that, The GaN has maxima drain current=5.98A(98.8%).
引用
收藏
页码:297 / 299
页数:3
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