Graphene Based Terahertz Light Modulator in Total Internal Reflection Geometry

被引:42
作者
Liu, Xudong [1 ]
Chen, Zefeng [1 ]
Parrott, Edward P. J. [1 ]
Ung, Benjamin S. -Y. [1 ]
Xu, Jianbin [1 ]
Pickwell-MacPherson, Emma [1 ]
机构
[1] Chinese Univ Hong Kong, Dept Elect Engn, Shatin, Hong Kong, Peoples R China
来源
ADVANCED OPTICAL MATERIALS | 2017年 / 5卷 / 03期
基金
美国国家科学基金会;
关键词
COHERENT PERFECT ABSORPTION;
D O I
10.1002/adom.201600697
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Modulation of visible light has been easily achieved for decades, but modulation of terahertz (THz) light still remains a challenge. To address this issue, the Fresnel equations have been developed to describe a conductive interface in a total internal reflection geometry and reveal a new approach for modulation. To demonstrate this new mechanism, a broadband device achieving a modulation depth greater than 90% between 0.15 and 0.4 THz, and reaching a maximum of 99.3% at 0.24 THz has been designed. The modulation is achieved by applying a gate voltage between -0.1 and 2 V to a graphene layer in a total internal reflection geometry. Compared to conventional designs, the high modulation is realized without assistance from metamaterial structures, resonant cavities, or multistacked graphene layers. Thus, the design is efficient and easy-to-fabricate and can be easily retrofitted to most existing THz systems. This work opens up a new avenue of research as the device has verified the theory and demonstrates how it can be used to make practical devices, bringing a promising new paradigm for THz modulation, thin-film sensing, and noninvasive material characterization.
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页数:7
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