A New Flexible Approach for Single Laser stripe profiler Calibration

被引：1
|
作者：
Bi, D. [1 ]
Lu, Xiao [1 ]
机构：
[1] TianJin Univ Sci & Technol, Dept Mech Engn, Tianjin 300222, Peoples R China
来源：
2008 INTERNATIONAL CONFERENCE ON INFORMATION AND AUTOMATION, VOLS 1-4 | 2008年
关键词：
Laser Stripe Profiler; Calibration from Planes; Projective Geometry; Line based Refinement;
D O I：
10.1109/ICINFA.2008.4607971
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
This paper presents a novel approach for Single Laser stripe profiler Calibration. It is well suited for use without specialized knowledge of 3D geometry or computer vision. The technique only requires the camera to observe a planar pattern intersecting with the laser plane shown at a few (at least three) different orientations. The planar pattern can be freely moved. The motion need not be known. The proposed procedure consists of a large input data for laser plane calibration optimization. Experiments demonstrate the validity and applicability of this approach.
引用
收藏
页码：76 / 80
页数：5
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