Structural analysis by field-emission scanning electron microscopy and atomic force microscopy

被引：0
|
作者：
Bornmann, S [1 ]
Lang, U [1 ]
Schmidt, HG [1 ]
Wendt, M [1 ]
机构：
[1] INST PHYS HOCHTECHNOL EV,D-07743 JENA,GERMANY
来源：
EUROPEAN JOURNAL OF CELL BIOLOGY | 1997年 / 74卷
关键词：
D O I：
暂无
中图分类号：
Q2 [细胞生物学];
学科分类号：
071009 ; 090102 ;
摘要：
引用
收藏
页码：17 / 17
页数：1
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