Bistatic system and baseline calibration in TanDEM-X to ensure the global digital elevation model quality

被引：56

作者：

Gonzalez, Jaime Hueso ^{[1
]}

Antony, John Mohan Walter ^{[1
]}

Bachmann, Markus ^{[1
]}

Krieger, Gerhard ^{[1
]}

Zink, Manfred ^{[1
]}

Schrank, Dirk ^{[1
]}

Schwerdt, Marco ^{[1
]}

机构：

[1] German Aerosp Ctr DLR, Microwaves & Radar Inst HR, D-82234 Wessling, Germany

来源：

ISPRS JOURNAL OF PHOTOGRAMMETRY AND REMOTE SENSING | 2012年 / 73卷

关键词：

Accuracy; Calibration; Digital; Interferometer; SAR; Satellite; Space; GRACE; GPS;

D O I：

10.1016/j.isprsjprs.2012.05.008

中图分类号：

P9 [自然地理学];

学科分类号：

0705 ; 070501 ;

摘要：

TanDEM-X is an operational satellite mission with the goal of generating a high quality global digital elevation model (DEM) based on synthetic aperture radar (SAR) interferometry in X-band. In order to ensure the quality of the DEM, the differential range measurements and knowledge of the interferometric baseline have to be extremely accurate. In this paper, the bistatic system calibration strategy implemented in TanDEM-X to achieve the desired DEM quality will be described, focusing on the baseline calibration procedure. The results of the tests, which were performed in parallel to the operational DEM acquisition, verify the suitability of this approach. (C) 2012 International Society for Photogrammetry and Remote Sensing, Inc. (ISPRS) Published by Elsevier B.V. All rights reserved.

引用

页码：3 / 11

页数：9

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