Single-atom electron microscopy for energy-related nanomaterials

被引：21
作者：
Xu, Mingquan [1 ]
Li, Aowen [1 ]
Gao, Meng [1 ]
Zhou, Wu [1 ,2 ]
机构：
[1] Univ Chinese Acad Sci, Sch Phys Sci, CAS Key Lab Vacuum Phys, Beijing 100049, Peoples R China
[2] Univ Chinese Acad Sci, CAS Ctr Excellence Topol Quantum Computat, Beijing 100049, Peoples R China
来源：
JOURNAL OF MATERIALS CHEMISTRY A | 2020年 / 8卷 / 32期
关键词：
PHASE-CONTRAST; VIBRATIONAL SPECTROSCOPY; STRUCTURE EVOLUTION; ACTIVE-SITES; RESOLUTION; CATALYSTS; NANOPARTICLES; GAS; SURFACE; PERFORMANCE;
D O I：
10.1039/d0ta04918b
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The development of the aberration correction technique has enabled atomic resolution imaging in scanning transmission electron microscopy (STEM) under low accelerating voltages and pushed the detection limit of STEM-based imaging and spectroscopy analysis down to the single-atom level. The so-called "single-atom electron microscopy" brings new opportunities to study the structure-property relationship in energy-related nanomaterials at the atomic scale. In this review, we will firstly summarize some recent advances in low-voltage STEM imaging and spectroscopy with single-atom sensitivity, including emerging techniques such as STEM-DPC imaging andin situSTEM, by using two-dimensional (2D) materials as model systems. We will then discuss the application of these single-atom electron microscopy techniques to more complex energy materialsviaspecific examples. These powerful and comprehensive capabilities of aberration-corrected STEM with single-atom sensitivity have proven to be invaluable for unveiling the origins of functionalities of energy-related nanomaterials and guiding the design of novel materials with desired performance.
引用
收藏
页码：16142 / 16165
页数：24
相关论文
共 198 条
  • [1] Novel MEMS-Based Gas-Cell/Heating Specimen Holder Provides Advanced Imaging Capabilities for In Situ Reaction Studies
    Allard, Lawrence F.
    Overbury, Steven H.
    Bigelow, Wilbur C.
    Katz, Michael B.
    Nackashi, David P.
    Damiano, John
    [J]. MICROSCOPY AND MICROANALYSIS, 2012, 18 (04) : 656 - 666
  • [2] A New MEMS-Based System for Ultra-High-Resolution Imaging at Elevated Temperatures
    Allard, Lawrence F.
    Bigelow, Wilbur C.
    Jose-Yacaman, Miguel
    Nackashi, David P.
    Damiano, John
    Mick, Stephen E.
    [J]. MICROSCOPY RESEARCH AND TECHNIQUE, 2009, 72 (03) : 208 - 215
  • [3] [Anonymous], 1960, ENG SCI
  • [4] Quantitative and Atomic-Scale View of CO-Induced Pt Nanoparticle Surface Reconstruction at Saturation Coverage via DFT Calculations Coupled with in Situ TEM and IR
    Avanesian, Talin
    Dai, Sheng
    Kale, Matthew J.
    Graham, George W.
    Pan, Xiaoqing
    Christopher, Phillip
    [J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2017, 139 (12) : 4551 - 4558
  • [5] Tracking Iridium Atoms with Electron Microscopy: First Steps of Metal Nanocluster Formation in One-Dimensional Zeolite Channels
    Aydin, Ceren
    Lu, Jing
    Liang, Ann J.
    Chen, Cong-Yan
    Browning, Nigel D.
    Gates, Bruce C.
    [J]. NANO LETTERS, 2011, 11 (12) : 5537 - 5541
  • [6] A class of non-precious metal composite catalysts for fuel cells
    Bashyam, Rajesh
    Zelenay, Piotr
    [J]. NATURE, 2006, 443 (7107) : 63 - 66
  • [7] Towards dense single-atom catalysts for future automotive applications
    Beniya, Atsushi
    Higashi, Shougo
    [J]. NATURE CATALYSIS, 2019, 2 (07) : 590 - 602
  • [8] Two-dimensional mapping of chemical information at atomic resolution
    Bosman, M.
    Keast, V. J.
    Garcia-Munoz, J. L.
    D'Alfonso, A. J.
    Findlay, S. D.
    Allen, L. J.
    [J]. PHYSICAL REVIEW LETTERS, 2007, 99 (08)
  • [9] Mapping chemical and bonding information using multivariate analysis of electron energy-loss spectrum images
    Bosman, M.
    Watanabe, M.
    Alexander, D. T. L.
    Keast, V. J.
    [J]. ULTRAMICROSCOPY, 2006, 106 (11-12) : 1024 - 1032
  • [10] Botton G., 2019, SPRINGER HDB MICROSC, P345
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