The thickness of native oxides on aluminum alloys and single crystals

被引：188

作者：

Evertsson, J. ^{[1
]}

Bertram, F. ^{[1
]}

Zhang, F. ^{[3
]}

Rullik, L. ^{[1
]}

Merte, L. R. ^{[1
]}

Shipilin, M. ^{[1
]}

Soldemo, M. ^{[5
]}

Ahmadi, S. ^{[5
]}

Vinogradov, N. ^{[4
]}

Carla, F. ^{[4
]}

Weissenrieder, J. ^{[5
]}

Gothelid, M. ^{[5
]}

Pan, J. ^{[3
]}

Mikkelsen, A. ^{[1
]}

Nilsson, J. -O. ^{[2
]}

Lundgren, E. ^{[1
]}

机构：

[1] Lund Univ, Div Synchrotron Radiat Res, S-22100 Lund, Sweden

[2] Sapa Technol, S-61231 Finspang, Sweden

[3] KTH Royal Inst Technol, Dept Chem, Div Surface & Corros Sci, S-10044 Stockholm, Sweden

[4] ESRF, F-38043 Grenoble, France

[5] KTH Royal Inst Technol, ICT, Mat Phys, S-16440 Kista, Sweden

来源：

APPLIED SURFACE SCIENCE | 2015年 / 349卷

关键词：

Aluminum alloy; Aluminum single crystal; Thin native oxide film thickness; Electrochemical impedance spectroscopy; X-ray reflectivity; X-ray photoelectron spectroscopy; CORE-LEVEL PHOTOEMISSION; DIFFRACTION BEAMLINE; AL(111); SURFACE; OXIDATION; CORROSION; SPECTROSCOPY; OXYGEN; SCALE; FILM;

D O I：

10.1016/j.apsusc.2015.05.043

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We present results from measurements of the native oxide film thickness on four different industrial aluminum alloys and three different aluminum single crystals. The thicknesses were determined using X-ray reflectivity, X-ray photoelectron spectroscopy, and electrochemical impedance spectroscopy. In addition, atomic force microscopy was used for micro-structural studies of the oxide surfaces. The reflectivity measurements were performed in ultra-high vacuum, vacuum, ambient, nitrogen and liquid water conditions. The results obtained using X-ray reflectivity and X-ray photoelectron spectroscopy demonstrate good agreement. However, the oxide thicknesses determined from the electrochemical impedance spectroscopy show a larger discrepancy from the above two methods. In the present contribution the reasons for this discrepancy are discussed. We also address the effect of the substrate type and the presence of water on the resultant oxide thickness. (C) 2015 Elsevier B.V. All rights reserved.

引用

页码：826 / 832

页数：7

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