Highly enhanced energy density induced by hetero-interface in sandwich-structured polymer nanocomposites
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作者:
Hu, Penghao
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Tsinghua Univ, State Key Lab New Ceram & Fine Proc, Dept Mat Sci & Engn, Beijing 100084, Peoples R ChinaTsinghua Univ, State Key Lab New Ceram & Fine Proc, Dept Mat Sci & Engn, Beijing 100084, Peoples R China
Hu, Penghao
[1
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Wang, Jianjun
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Tsinghua Univ, State Key Lab New Ceram & Fine Proc, Dept Mat Sci & Engn, Beijing 100084, Peoples R ChinaTsinghua Univ, State Key Lab New Ceram & Fine Proc, Dept Mat Sci & Engn, Beijing 100084, Peoples R China
Wang, Jianjun
[1
]
Shen, Yang
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Tsinghua Univ, State Key Lab New Ceram & Fine Proc, Dept Mat Sci & Engn, Beijing 100084, Peoples R ChinaTsinghua Univ, State Key Lab New Ceram & Fine Proc, Dept Mat Sci & Engn, Beijing 100084, Peoples R China
Shen, Yang
[1
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Guan, Yuhan
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Tsinghua Univ, State Key Lab New Ceram & Fine Proc, Dept Mat Sci & Engn, Beijing 100084, Peoples R ChinaTsinghua Univ, State Key Lab New Ceram & Fine Proc, Dept Mat Sci & Engn, Beijing 100084, Peoples R China
Guan, Yuhan
[1
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Lin, Yuanhua
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Tsinghua Univ, State Key Lab New Ceram & Fine Proc, Dept Mat Sci & Engn, Beijing 100084, Peoples R ChinaTsinghua Univ, State Key Lab New Ceram & Fine Proc, Dept Mat Sci & Engn, Beijing 100084, Peoples R China
Lin, Yuanhua
[1
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Nan, Ce-Wen
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Tsinghua Univ, State Key Lab New Ceram & Fine Proc, Dept Mat Sci & Engn, Beijing 100084, Peoples R ChinaTsinghua Univ, State Key Lab New Ceram & Fine Proc, Dept Mat Sci & Engn, Beijing 100084, Peoples R China
Nan, Ce-Wen
[1
]
机构:
[1] Tsinghua Univ, State Key Lab New Ceram & Fine Proc, Dept Mat Sci & Engn, Beijing 100084, Peoples R China
A novel sandwich-structured polymer-based nanocomposite with different dielectric fillers stacked together was fabricated employing a layer-by-layer casting process. In the sandwich-structured composite poly(vinylidene fluoride)-based film, the outer layer with TiO2 nanoparticles increased the electric displacement while the central layer with paraelectric BaSrTO3 nanofibers maintained the high breakdown strength. Compared with single layer films, the extractable energy density was greatly enhanced in the sandwich-structured film. Instead of solely being stored at the interface between the dielectrics and the electrodes as in a conventional capacitor, charges are also stored at the additional interfaces between the two heterofilm layers within the multilayer dielectric nanocomposite. A numerical simulation was performed to solve the electrostatic equilibrium equation and then to obtain the scenario of charge storage at the hetero interfaces inside the nanocomposite.
机构:Tsinghua Univ, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
Dang, ZM
;
Lin, YH
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机构:Tsinghua Univ, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
Lin, YH
;
Nan, CW
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机构:
Tsinghua Univ, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R ChinaTsinghua Univ, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
机构:
USAF, Mat & Mfg Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA
CNR, Washington, DC 20418 USAUSAF, Mat & Mfg Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA
Fillery, Scott P.
;
Koerner, Hilmar
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机构:
UES, Dayton, OH USAUSAF, Mat & Mfg Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA
Koerner, Hilmar
;
Drummy, Lawrence
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机构:
UES, Dayton, OH USAUSAF, Mat & Mfg Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA
Drummy, Lawrence
;
Dunkerley, Erik
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机构:
Univ Massachusetts, Dept Plast Engn, Lowell, MA USAUSAF, Mat & Mfg Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA
Dunkerley, Erik
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Durstock, Michael F.
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机构:
USAF, Mat & Mfg Directorate, Res Lab, Wright Patterson AFB, OH 45433 USAUSAF, Mat & Mfg Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA
Durstock, Michael F.
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Schmidt, Daniel F.
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h-index: 0
机构:
Univ Massachusetts, Dept Plast Engn, Lowell, MA USAUSAF, Mat & Mfg Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA
Schmidt, Daniel F.
;
Vaia, Richard A.
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机构:
USAF, Mat & Mfg Directorate, Res Lab, Wright Patterson AFB, OH 45433 USAUSAF, Mat & Mfg Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA
机构:Tsinghua Univ, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
Dang, ZM
;
Lin, YH
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机构:Tsinghua Univ, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
Lin, YH
;
Nan, CW
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h-index: 0
机构:
Tsinghua Univ, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R ChinaTsinghua Univ, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
机构:
USAF, Mat & Mfg Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA
CNR, Washington, DC 20418 USAUSAF, Mat & Mfg Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA
Fillery, Scott P.
;
Koerner, Hilmar
论文数: 0引用数: 0
h-index: 0
机构:
UES, Dayton, OH USAUSAF, Mat & Mfg Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA
Koerner, Hilmar
;
Drummy, Lawrence
论文数: 0引用数: 0
h-index: 0
机构:
UES, Dayton, OH USAUSAF, Mat & Mfg Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA
Drummy, Lawrence
;
Dunkerley, Erik
论文数: 0引用数: 0
h-index: 0
机构:
Univ Massachusetts, Dept Plast Engn, Lowell, MA USAUSAF, Mat & Mfg Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA
Dunkerley, Erik
;
Durstock, Michael F.
论文数: 0引用数: 0
h-index: 0
机构:
USAF, Mat & Mfg Directorate, Res Lab, Wright Patterson AFB, OH 45433 USAUSAF, Mat & Mfg Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA
Durstock, Michael F.
;
Schmidt, Daniel F.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Massachusetts, Dept Plast Engn, Lowell, MA USAUSAF, Mat & Mfg Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA
Schmidt, Daniel F.
;
Vaia, Richard A.
论文数: 0引用数: 0
h-index: 0
机构:
USAF, Mat & Mfg Directorate, Res Lab, Wright Patterson AFB, OH 45433 USAUSAF, Mat & Mfg Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA