Structural study of the Cu2+-loaded copper hexacyanoferrate electrode deposited on indium tin oxide substrate

被引：4

作者：

Giorgetti, M. ^{[1
]}

Aquilanti, G. ^{[1
]}

Minicucci, M. ^{[1
]}

机构：

[1] Univ Bologna, Dept Phys & Inorgan Chem, I-40137 Bologna, Italy

来源：

15TH INTERNATIONAL CONFERENCE ON X-RAY ABSORPTION FINE STRUCTURE (XAFS15) | 2013年 / 430卷

关键词：

RAY-ABSORPTION SPECTROSCOPY; BODY DISTRIBUTION-FUNCTIONS; CONDENSED MATTER; PERFORMANCES;

D O I：

10.1088/1742-6596/430/1/012049

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

We report the structural characterization by XAFS spectroscopy at the Cu K-edge of three different CuHCF-based electrodes deposited on ITO (indium tin oxide) substrate. The electrochemical characterization confirms the occurrence of typical CuHCF films on the ITO surface. The EXAFS analysis evidences the strong multiple scattering effects in these compounds which makes the EXAFS probe effective for distances up to 5 angstrom from the photo-absorber. The presence of Cu-N-C-Fe linear chains with a high multiplicity has allowed us to determine accurately the local environment of Cu which also includes the Fe atom. The XAFS characterization of the Cu2+-loaded CuHCF shows the best agreement with the structural model for copper hexacyanoferrate, which also features [Fe(CN)(6)](3-) ion vacancies.

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页数：5

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