Optical characterisation of lithium fluoride detectors for broadband X-ray imaging

被引：12

作者：

Bateni, S. Heidari ^{[1
]}

Bonfigli, F. ^{[2
]}

Cecilia, A. ^{[3
]}

Baumbach, T. ^{[3
]}

Pelliccia, D. ^{[3
,4
]}

Somma, F. ^{[1
]}

Vincenti, M. A. ^{[2
]}

Montereali, R. M. ^{[2
]}

机构：

[1] Univ Roma Tre, Dept Phys, I-00146 Rome, Italy

[2] ENEA, CR Frascati, Photon Micro & Nanostruct Lab, UTAPRAD MNF, I-00044 Rome, Italy

[3] Res Ctr Karlsruhe KIT, Inst Synchrotron Radiat ANKA, Karlsruhe, Germany

[4] Monash Univ, Sch Phys, ARC Ctr Excellence Coherent Xray Sci, Clayton, Vic 3800, Australia

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2013年 / 720卷

关键词：

X-ray imaging detector; Lithium fluoride; Colour centre; Photoluminescence; Synchrotron X-rays; F-AGGREGATE CENTERS; COLOR-CENTERS; LIF; MICROSCOPY;

D O I：

10.1016/j.nima.2012.12.023

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Novel X-ray imaging detectors based on photoluminescence of colour centres in lithium fluoride (LiF) have been proposed and tested for extreme ultraviolet, soft and hard X-rays up to 10 keV. For the first time we present the optical characterisation of LiF crystals and thin films irradiated at the TOPO-TOMO beamline of synchroton light source Anka (Karlsruhe, Germany) in the energy range 6-40 keV for different exposure times. Absorption and photoluminescence spectra were analysed to study the optical response of the LiF-based detectors. High resolved X-ray imaging of commercial test patterns has been obtained on LiF crystals and films by optical readout with a confocal laser scanning fluorescence microscope. (C) 2012 Elsevier B.V. All rights reserved.

引用

页码：109 / 112

页数：4

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