Surface characterization of TTF-TCNQ thin films evaporated on alkali halide substrates

被引：7
作者：
Caro, J
Fraxedas, J
Santiso, J
Figueras, A
Gorostiza, P
Sanz, F
机构：
[1] CSIC, Inst Ciencia Mat Barcelona, E-08193 Barcelona, Spain
[2] Univ Barcelona, Dept Quim Fis, E-08028 Barcelona, Spain
来源：
SYNTHETIC METALS | 1999年 / 102卷 / 1-3期
关键词：
evaporation and sublimation; polycrystalline thin films; X-ray diffraction; scanning electron microscopy; atomic force microscopy;
D O I：
10.1016/S0379-6779(98)00411-1
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Thin films of TTF-TCNQ have been grown on ex situ cleaved NaCl (001) and KCl (001) substrates by thermal evaporation in high vacuum. The films are polycrystalline and textured, composed of microcrystals with rectangular shape with the c* crystallographic axis perpendicular to the substrate. The in-plane texture of the films has been studied by X-ray diffraction (XRD) and the surface morphology has been analyzed by means of Scanning Electron Microscopy (SEM) and Tapping Mode Atomic Force Microscopy (TMAFM).
引用
收藏
页码：1607 / 1608
页数：2
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