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Epitaxial growth and improved electronic properties of (Bi1-xSbx)2Te3 thin films grown on sapphire (0001) substrates: The influence of Sb content and the annealing
被引:10
|作者:
Liu, Wei
[1
]
Stoica, Vladimir
[1
]
Chi, Hang
[1
]
Endicott, Lynn
[1
]
Uher, Ctirad
[1
]
机构:
[1] Univ Michigan, Dept Phys, Ann Arbor, MI 48109 USA
关键词:
(Bi1-xSbx)(2)Te-3 thin films;
Molecular beam epitaxy;
Point defects;
Film orientation;
Electronic properties;
Post-annealing;
HIGH-THERMOELECTRIC PERFORMANCE;
ANTISITE DEFECTS;
TELLURIDE;
FIGURE;
BI2TE3;
CRYSTALS;
SB2TE3;
MERIT;
D O I:
10.1016/j.jallcom.2015.06.144
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
In this research, we report on the epitaxial growth of basal plane-oriented (Bi1-xSbx)(2)Te-3 films (0 <= x <= 1) on sapphire (0001) substrates through Molecular Beam Epitaxy (MBE) and demonstrate the influence of composition, crystal orientation and post-annealing process on their electronic properties. The as-grown (Bi1-xSbx)(2)Te-3 films change gradually from a strong n-type to a strong p-type conduction when the Sb content increases from 0 to 1, which is attributed to the charge carrier compensation between the n-type Te-Bi and p-type Sb-Te antisite defects. The crossover between the n- and p-type conduction is found for x between 0.6 and 0.7. We also find that post-annealing (at 580 K) is beneficial for the electronic properties of the p-type (Bi1-xSbx)(2)Te-3 films: they attain improved carrier mobility and significantly increased hole density. However, annealing plays a negative role in the electronic properties of the n-type structures leading to an enhanced resistivity as well as a reduced Seebeck coefficient. The most plausible explanation for such annealing effects is an introduction of p-type defects in both the n-type and p-type (Bi1-xSbx)(2)Te-3 films. The as-grown Bi2Te3 film possesses the largest thermoelectric power factor among all n-type films, reaching 4.1 and 2.5 mWm(-1) K-2 at 122 and 300 K respectively, due to the high carrier mobility and proper carrier doping. In contrast, a remarkably improved power factor in p-type (Bi1-xSbx)(2)Te-3 films is achieved upon annealing at 580 K for 1 h. The highest power factor in p-type Bi0.6Sb1.4Te3 and Sb2Te3 films is obtained at around 150 K and it increases from 0.2 mWm(-1) K-2 (Bi0.6Sb1.4Te3) and 1.8 mWm(-1) K-2 (Sb2Te3) for the as-grown films to 3.5 mWm(-1) K-2, respectively 3.7 mWm(-1) K-2 for the annealed films. The highly crystalline nature of (Bi1-xSbx)(2)Te-3 films grown by MBE assures excellent carrier mobility and is a contributing factor to their outstanding power factors. (C) 2015 Elsevier B.V. All rights reserved.
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页码:50 / 56
页数:7
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