Piezoresponse force microscopy and nanoferroic phenomena

被引:329
作者
Gruverman, Alexei [1 ]
Alexe, Marin [2 ]
Meier, Dennis [3 ]
机构
[1] Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USA
[2] Univ Warwick, Dept Phys, Coventry CV4 7AL, W Midlands, England
[3] Norwegian Univ Sci & Technol NTNU, Dept Mat Sci & Engn, N-7034 Trondheim, Norway
基金
美国国家科学基金会; 英国工程与自然科学研究理事会;
关键词
DOMAIN-WALLS; PIEZOELECTRIC PROPERTIES; FERROELECTRIC DOMAINS; INDUCED POLARIZATION; CONDUCTION; FILMS; NUCLEATION; TITANATE;
D O I
10.1038/s41467-019-09650-8
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Since its inception more than 25 years ago, Piezoresponse Force Microscopy (PFM) has become one of the mainstream techniques in the field of nanoferroic materials. This review describes the evolution of PFM from an imaging technique to a set of advanced methods, which have played a critical role in launching new areas of ferroic research, such as multiferroic devices and domain wall nanoelectronics. The paper reviews the impact of advanced PFM modes concerning the discovery and scientific understanding of novel nanoferroic phenomena and discusses challenges associated with the correct interpretation of PFM data. In conclusion, it offers an outlook for future trends and developments in PFM.
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页数:9
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