Atmospheric Pressure Radio-Frequency DBD Deposition of Dense Silicon Dioxide Thin Film

被引:24
作者
Bazinette, Remy [1 ,2 ]
Paillol, Jean [2 ]
Lelievre, Jean-Francois [1 ]
Massines, Francoise [1 ]
机构
[1] CNRS PROMES, Rambla Thermodynam, F-66100 Perpignan, France
[2] Univ Pau & Pays Adour, SIAME, F-66120 Pau, France
关键词
atmospheric pressure; dielectric barrier discharge; duty cycle; PECVD; pulsed plasma; radio-frequency; room temperature; silane; CHEMICAL-VAPOR-DEPOSITION; GLOW-DISCHARGE; PLASMA; TETRAETHOXYSILANE; SIO2-FILMS; PYROLYSIS; STRESS;
D O I
10.1002/ppap.201600038
中图分类号
O59 [应用物理学];
学科分类号
摘要
Radio-frequency (RF) homogeneous dielectric barrier discharge (DBD) is compared to low frequency glow DBD to make silicon oxide from Ar/NH3/SiH4. RF-DBD is a more powerful discharge, and the growth rate is not limited by precursor dissociation rate but by powder formation. Powders are not deposited in the plasma zone but in the post-discharge due to their trapping by the electric field. Modulation of the RF-DBD is a useful solution to avoid powder formation. Powders are systematically avoided if the plasma energy during time on stays below 750 mu J. RF-DBD modulation also increases the growth rate twofold compare to continuous RF. The optimum growth rate without powder corresponds to a short T-on to limit precursor dissociation, a long T-off to enhance diffusion and a fast repeat frequency to increase deposition rate.
引用
收藏
页码:1015 / 1024
页数:10
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