Nonparametric Bayesian Lifetime Data Analysis using Dirichlet Process Lognormal Mixture Model

被引:15
作者
Cheng, Nan [1 ]
Yuan, Tao [1 ]
机构
[1] Ohio Univ, Dept Ind & Syst Engn, Athens, OH 45701 USA
基金
美国国家科学基金会;
关键词
reliability; lifetime data analysis; nonparametric Bayesian methods; Dirichlet process mixture model; Gibbs sampling; INFERENCE; DISTRIBUTIONS;
D O I
10.1002/nav.21529
中图分类号
C93 [管理学]; O22 [运筹学];
学科分类号
070105 ; 12 ; 1201 ; 1202 ; 120202 ;
摘要
We propose a nonparametric Bayesian lifetime data analysis method using the Dirichlet process mixture model with a lognormal kernel. A simulation-based algorithm that implements the Gibbs sampling is developed to fit the Dirichlet process lognormal mixture (DPLNM) model using rightly censored failure time data. Five examples are used to illustrate the proposed method, and the DPLNM model is compared to the Dirichlet process Weibull mixture (DPWM) model. Results indicate that the DPLNM model is capable of estimating different lifetime distributions. The DPLNM model outperforms the DPWM model in all the examples, and the DPLNM model shows promising potential to be applied to analyze failure time data when an appropriate parametric model for the data cannot be specified. (C) 2013 Wiley Periodicals, Inc. Naval Research Logistics 60: 208-221, 2013
引用
收藏
页码:208 / 221
页数:14
相关论文
共 26 条
[1]  
[Anonymous], 2003, Bayesian Data Analysis
[2]   MIXTURES OF DIRICHLET PROCESSES WITH APPLICATIONS TO BAYESIAN NONPARAMETRIC PROBLEMS [J].
ANTONIAK, CE .
ANNALS OF STATISTICS, 1974, 2 (06) :1152-1174
[3]  
ARJAS E, 1994, STAT SINICA, V4, P505
[4]   DISCRETENESS OF FERGUSON SELECTIONS [J].
BLACKWELL, D .
ANNALS OF STATISTICS, 1973, 1 (02) :356-358
[5]   FERGUSON DISTRIBUTIONS VIA POLYA URN SCHEMES [J].
BLACKWELL, D ;
MACQUEEN, JB .
ANNALS OF STATISTICS, 1973, 1 (02) :353-355
[6]  
Damien P, 1999, J ROY STAT SOC B, V61, P331
[7]   A new model for the field dependence of intrinsic and extrinsic time-dependent dielectric breakdown [J].
Degraeve, R ;
Ogier, JL ;
Bellens, R ;
Roussel, PJ ;
Groeseneken, G ;
Maes, HE .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1998, 45 (02) :472-481
[8]   TAILFREE AND NEUTRAL RANDOM PROBABILITIES AND THEIR POSTERIOR DISTRIBUTIONS [J].
DOKSUM, K .
ANNALS OF PROBABILITY, 1974, 2 (02) :183-201
[9]   A BAYESIAN NONPARAMETRIC APPROACH TO RELIABILITY [J].
DYKSTRA, RL ;
LAUD, P .
ANNALS OF STATISTICS, 1981, 9 (02) :356-367
[10]  
Ebeling CE., 2019, An introduction to reliability and maintainability engineering