Efficient Bragg diffraction in thin semiconductor two-dimensional gratings

被引：1

作者：

He, Q. ^{[1
,2
,4
]}

Zaquine, I. ^{[1
,2
]}

Andre, R. ^{[3
]}

Roosen, G. ^{[4
]}

Frey, R. ^{[1
,2
,4
]}

机构：

[1] Telecom ParisTech, CNRS, Lab Traitement & Commun Informat, Dep TSI, F-75634 Paris 13, France

[2] Telecom ParisTech, Inst Telecom, Dep TSI, F-75634 Paris 13, France

[3] CEA, CNRS, Inst NEEL, Grp Nanophys & Semicond, F-38042 Grenoble, France

[4] CNRS Campus Polytech, Inst Opt, Lab Charles Fabry, F-91128 Palaiseau, France

来源：

OPTICS LETTERS | 2008年 / 33卷 / 23期

关键词：

D O I：

10.1364/OL.33.002868

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Highly improved diffraction properties are demonstrated in a two-dimensional [2D] grating consisting of a transmission grating optically recorded in a semiconductor one-dimensional photonic crystal (1D-PC). Near unity internal diffraction efficiency, high wavelength selectivity, and Bragg diffraction regime operation are demonstrated when the read beam is set at Bragg incidence on the transmission grating while its wavelength corresponds to the band edge of the 3 Am thick 1D-PC. When the 2D grating is grown on a Bragg mirror, a single diffracted beam is obtained, which makes the device promising for optical signal processing. (C) 2008 Optical Society of America

引用

页码：2868 / 2870

页数：3

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