Substrate-step-induced effects on the growth of CaF2 on Si (111)

被引:18
作者
Wollschläger, J [1 ]
机构
[1] Leibniz Univ Hannover, Inst Festkorperphys, D-30167 Hannover, Germany
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2002年 / 75卷 / 01期
关键词
D O I
10.1007/s003390101064
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The growth of CaF2 on vicinal Si(111) surfaces was studied by scanning tunneling microscopy (STM) and atomic force microscopy (AFM) for the temperature range from 300 to 750 degreesC. In the submonolayer range a transition from terrace to step nucleation is observed for increasing temperature. The first monolayer grows in the step-flow growth mode since second layer islands are not nucleated before completion of the wetting layer. For the subsequent growth of CaF2 on the CaF interface layer, substrate-induced steps do not act as preferential nucleation sites, but rather as growth barriers. Thus CaF2 films grow very inhomogeneously at high temperatures. At lower deposition temperatures, the film homogeneity increases due to the increased (homogeneous) nucleation rate on terraces, The lattice mismatch leads to (lateral) relaxation of thicker CaF2 film close to substrate steps. In addition, CaF2 self-decoration effects are caused by the relaxed regions close to the film steps at temperatures above 500degreesC.
引用
收藏
页码:155 / 166
页数:12
相关论文
共 57 条
[1]   HETEROEPITAXIAL GROWTH OF GROUP-IIA-FLUORIDE FILMS ON SI SUBSTRATES [J].
ASANO, T ;
ISHIWARA, H ;
KAIFU, N .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1983, 22 (10) :1474-1481
[2]   Reflection electron microscopy observation of the behavior of monoatomic steps on the silicon surfaces [J].
Aseev, AL ;
Latyshev, AV ;
Krasilnikov, AB .
SURFACE REVIEW AND LETTERS, 1997, 4 (03) :551-558
[3]   SCANNING TUNNELING MICROSCOPY OF INSULATORS - CAF2 EPITAXY ON SI(111) [J].
AVOURIS, P ;
WOLKOW, R .
APPLIED PHYSICS LETTERS, 1989, 55 (11) :1074-1076
[4]  
BIERKANDT M, UNPUB
[5]  
BIERKANDT M, COMMUNICATION
[6]   PHYSICS IN LESS THAN 3 DIMENSIONS [J].
CHALLIS, LJ .
CONTEMPORARY PHYSICS, 1992, 33 (02) :111-127
[7]   GROWTH-KINETICS OF CAF2/SI(111) HETEROEPITAXY - AN X-RAY PHOTOELECTRON DIFFRACTION STUDY [J].
DENLINGER, JD ;
ROTENBERG, E ;
HESSINGER, U ;
LESKOVAR, M ;
OLMSTEAD, MA .
PHYSICAL REVIEW B, 1995, 51 (08) :5352-5365
[8]   VARIABLE GROWTH MODES OF CAF2 ON SI(111) DETERMINED BY X-RAY PHOTOELECTRON DIFFRACTION [J].
DENLINGER, JD ;
ROTENBERG, E ;
HESSINGER, U ;
LESKOVAR, M ;
OLMSTEAD, MA .
APPLIED PHYSICS LETTERS, 1993, 62 (17) :2057-2059
[9]   ROLE OF STEP AND TERRACE NUCLEATION IN HETEROEPITAXIAL GROWTH-MORPHOLOGY - GROWTH-KINETICS OF CAF2/SI(111) [J].
HESSINGER, U ;
LESKOVAR, M ;
OLMSTEAD, MA .
PHYSICAL REVIEW LETTERS, 1995, 75 (12) :2380-2383
[10]   STRUCTURE AND BONDING AT THE CAF2/SI (111) INTERFACE [J].
HIMPSEL, FJ ;
HILLEBRECHT, FU ;
HUGHES, G ;
JORDAN, JL ;
KARLSSON, UO ;
MCFEELY, FR ;
MORAR, JF ;
RIEGER, D .
APPLIED PHYSICS LETTERS, 1986, 48 (09) :596-598