200-GHz bandwidth on wafer characterization of CMOS nonlinear transmission line using electro-optic sampling

被引：7

作者：

Jamshidifar, M. ^{[1
]}

Spickermann, G. ^{[1
]}

Schaefer, H. ^{[1
]}

Bolivar, P. Haring ^{[1
]}

机构：

[1] Univ Siegen, Inst High Frequency & Quantum Elect HQE, D-57068 Siegen, Germany

来源：

MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 2012年 / 54卷 / 08期

关键词：

electro-optic sampling; nonlinear transmission line; timing jitter; SYSTEM; PROBE;

D O I：

10.1002/mop.26954

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A free running electro-optic sampling system for on wafer characterization of a 65-nm technology CMOS nonlinear transmission line with the assessment of device performance up to 200 GHz is described. Noise and relative timing jitter between laser and microwave source, as the major limiting factors for the system dynamic range and bandwidth, are studied. Eventually enhancing the system measurement bandwidth using a fast method, and durable against timing jitter, is achieved at the expense of degraded system noise. (C) 2012 Wiley Periodicals, Inc. Microwave Opt Technol Lett 54:18581862, 2012; View this article online at wileyonlinelibrary.com. DOI 10.1002/mop.26954

引用

页码：1858 / 1862

页数：5

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