High-Voltage Nano-oxidation in Deionized Water and Atmospheric Environments by Atomic Force Microscopy

被引:7
|
作者
Huang, Jen-Ching [1 ]
Chen, Chung-Ming [2 ]
机构
[1] Tungnan Univ, Dept Mech Engn, New Taipei City 222, Taiwan
[2] Tungnan Univ, Inst Mechatron Engn, New Taipei City 222, Taiwan
关键词
metallic probe; nano-oxidation; atomic force microscopy (AFM); high-bias voltage; deionized water; atmospheric environment; INDUCED LOCAL OXIDATION; NANOFABRICATION;
D O I
10.1002/sca.20298
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
This study used atomic force microscopy (AFM), metallic probes with a nanoscale tip, and high-voltage generators to investigate the feasibility of high-voltage nano-oxidation processing in deionized water (DI water) and atmospheric environments. Researchers used a combination of wirecutting and electrochemical etching to transform a 20-mu m-thick stainless steel sheet into a conductive metallic AFM probe with a tip radius of 60 nm, capable of withstanding high voltages. The combination of AFM, high-voltage generators, and nanoscale metallic probes enabled nano-oxidation processing at 200 V in DI water environments, producing oxides up to 66.6 nm in height and 467.03 nm in width. Oxides produced through highvoltage nano-oxidation in atmospheric environments were 117.29 nm in height and 551.28 nm in width, considerably exceeding the dimensions of those produced in DI water. An increase in the applied bias voltage led to an apparent logarithmic increase in the height of the oxide dots in the range of 200-400 V. The performance of the proposed high-voltage nano-oxidation technique was relatively high with seamless integration between the AFM machine and the metallic probe fabricated in this study. SCANNING 34: 230-236, 2012 (c) 2011 Wiley Periodicals, Inc.
引用
收藏
页码:230 / 236
页数:7
相关论文
共 50 条
  • [1] High aspect ratio nano-oxidation of silicon with noncontact atomic force microscopy
    Clement, N
    Tonneau, D
    Gely, B
    Dallaporta, H
    Safarov, V
    Gautier, J
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2003, 21 (06): : 2348 - 2351
  • [2] Nano-oxidation of vanadium thin films using atomic force microscopy
    Vaccaro, PO
    Sakata, S
    Yamaoka, S
    Umezu, I
    Sugimura, A
    JOURNAL OF MATERIALS SCIENCE LETTERS, 1998, 17 (22) : 1941 - 1943
  • [3] Nano-oxidation of silicon surfaces by noncontact atomic-force microscopy:: Size dependence on voltage and pulse duration
    Calleja, M
    García, R
    APPLIED PHYSICS LETTERS, 2000, 76 (23) : 3427 - 3429
  • [4] Theoretical and experimental studies for nano-oxidation of silicon wafer by ac atomic force microscopy
    Lin, JF
    Tai, CK
    Lin, SL
    JOURNAL OF APPLIED PHYSICS, 2006, 99 (05)
  • [5] Large scale high precision nano-oxidation using an atomic force microscope
    Kuramochi, H
    Ando, K
    Tokizaki, T
    Yasutake, A
    Pérez-Murano, F
    Dagata, JA
    Yokoyama, H
    SURFACE SCIENCE, 2004, 566 : 343 - 348
  • [6] Nano-oxidation of silicon surfaces:: Comparison of noncontact and contact atomic-force microscopy methods
    Tello, M
    García, R
    APPLIED PHYSICS LETTERS, 2001, 79 (03) : 424 - 426
  • [7] Enhanced nano-oxidation on a SCl-treated Si surface using atomic force microscopy
    Moon, WC
    Yoshinobu, T
    Iwasaki, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2002, 41 (7A): : 4754 - 4757
  • [8] Applied voltage dependence of nano-oxidation of ferromagnetic thin films using atomic force microscope
    Takemura, Y
    Kidaka, S
    Watanabe, K
    Nasu, Y
    Yamada, T
    Shirakashi, J
    JOURNAL OF APPLIED PHYSICS, 2003, 93 (10) : 7346 - 7348
  • [9] Nano-oxidation of an amorphous silicon surface with an atomic force microscope
    Umezu, I
    Yoshida, T
    Matsumoto, K
    Inada, M
    Sugimura, A
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 2002, 299 : 1090 - 1094
  • [10] Tuning photonic nanocavities by atomic force microscope nano-oxidation
    Hennessy, K.
    Hoegerle, C.
    Hu, E.
    Badolato, A.
    Imamoglu, A.
    APPLIED PHYSICS LETTERS, 2006, 89 (04)