High-Voltage Nano-oxidation in Deionized Water and Atmospheric Environments by Atomic Force Microscopy

被引:7
作者
Huang, Jen-Ching [1 ]
Chen, Chung-Ming [2 ]
机构
[1] Tungnan Univ, Dept Mech Engn, New Taipei City 222, Taiwan
[2] Tungnan Univ, Inst Mechatron Engn, New Taipei City 222, Taiwan
关键词
metallic probe; nano-oxidation; atomic force microscopy (AFM); high-bias voltage; deionized water; atmospheric environment; INDUCED LOCAL OXIDATION; NANOFABRICATION;
D O I
10.1002/sca.20298
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
This study used atomic force microscopy (AFM), metallic probes with a nanoscale tip, and high-voltage generators to investigate the feasibility of high-voltage nano-oxidation processing in deionized water (DI water) and atmospheric environments. Researchers used a combination of wirecutting and electrochemical etching to transform a 20-mu m-thick stainless steel sheet into a conductive metallic AFM probe with a tip radius of 60 nm, capable of withstanding high voltages. The combination of AFM, high-voltage generators, and nanoscale metallic probes enabled nano-oxidation processing at 200 V in DI water environments, producing oxides up to 66.6 nm in height and 467.03 nm in width. Oxides produced through highvoltage nano-oxidation in atmospheric environments were 117.29 nm in height and 551.28 nm in width, considerably exceeding the dimensions of those produced in DI water. An increase in the applied bias voltage led to an apparent logarithmic increase in the height of the oxide dots in the range of 200-400 V. The performance of the proposed high-voltage nano-oxidation technique was relatively high with seamless integration between the AFM machine and the metallic probe fabricated in this study. SCANNING 34: 230-236, 2012 (c) 2011 Wiley Periodicals, Inc.
引用
收藏
页码:230 / 236
页数:7
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