A Power-Efficient Digital Technique for Gain and Offset Correction in Slope ADCs

被引:5
作者
Klosowski, M. [1 ]
机构
[1] Gdansk Univ Technol, Fac Elect Telecommun & Informat, PL-80233 Gdansk, Poland
关键词
Digital image sensor; digital pixel; fixed pattern noise (FPN); gain correction; offset correction; photo-response non-uniformity (PRNU); IMAGE; SENSOR; CAMERA;
D O I
10.1109/TCSII.2019.2928183
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this brief, a power-efficient digital technique for gain and offset correction in slope analog-to-digital converters (ADCs) has been proposed. The technique is especially useful for imaging arrays with massively parallel image acquisition where simultaneous compensation of dark signal non-uniformity (DSNU) as well as photo-response non-uniformity (PRNU) is critical. The presented approach is based on stopping the ADC clock by a specially prepared clock-enable pulse sequence. This brief describes the properties of ADCs utilizing this clock stopping technique, including power dissipation, integral, and differential nonlinearity. The experimental validation has been performed for the ASIC implementation of the 128-pixel imager containing photo-sensors integrated with ADCs. Finally, a modification is proposed that increases the accuracy of the gain correction. Measurements confirm functionality of the proposed approach. Reduction of the PRNU (to similar to 0.4 LSB) has been achieved as well.
引用
收藏
页码:979 / 983
页数:5
相关论文
共 16 条
[1]  
[Anonymous], 2006, 2006 IEEE INT SOLID
[2]  
Beaverson G. K., 1987, U.S. Patent, Patent No. [4 698 685, 4698685]
[3]   High-Speed-Camera based on a CMOS active pixel sensor [J].
Bloss, HS ;
Ernst, JD ;
Firla, H ;
Schmoelz, SC ;
Gick, SK ;
Lauxtermann, S .
HIGH-SPEED IMAGING AND SEQUENCE ANALYSIS II, 2000, 3968 :31-38
[4]   Determining image origin and integrity using sensor noise [J].
Chen, Mo ;
Fridrich, Jessica ;
GoIjan, Miroslav ;
Lukas, Jan .
IEEE TRANSACTIONS ON INFORMATION FORENSICS AND SECURITY, 2008, 3 (01) :74-90
[5]   Design and Tests of the Vertically Integrated Photon Imaging Chip [J].
Deptuch, Grzegorz W. ;
Carini, Gabriella ;
Grybos, Pawel ;
Kmon, Piotr ;
Maj, Piotr ;
Trimpl, Marcel ;
Siddons, David P. ;
Szczygiel, Robert ;
Yarema, Raymond .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2014, 61 (01) :663-674
[6]   CMOS image sensors [J].
El Gamal, A ;
Eltoukhy, H .
IEEE CIRCUITS & DEVICES, 2005, 21 (03) :6-20
[7]   Pixel-Parallel 3-D Integrated CMOS Image Sensors With Pulse Frequency Modulation A/D Converters Developed by Direct Bonding of SOI Layers [J].
Goto, Masahide ;
Hagiwara, Kei ;
Iguchi, Yoshinori ;
Ohtake, Hiroshi ;
Saraya, Takuya ;
Kobayashi, Masaharu ;
Higurashi, Eiji ;
Toshiyoshi, Hiroshi ;
Hiramoto, Toshiro .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2015, 62 (11) :3530-3535
[8]   A Computational Digital Pixel Sensor Featuring Block-Readout Architecture for On-Chip Image Processing [J].
Ito, Kiyoto ;
Tongprasit, Benjamas ;
Shibata, Tadashi .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2009, 56 (01) :114-123
[9]   An Analog Sub-Miliwatt CMOS Image Sensor With Pixel-Level Convolution Processing [J].
Jendernalik, W. ;
Blakiewicz, G. ;
Jakusz, J. ;
Szczepanski, S. ;
Piotrowski, R. .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2013, 60 (02) :279-289
[10]   A High-Efficient Measurement System With Optimization Feature for Prototype CMOS Image Sensors [J].
Klosowski, M. ;
Jakusz, J. ;
Jendernalik, W. ;
Blakiewicz, G. ;
Szczepanski, S. ;
Koziel, S. .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2018, 67 (10) :2363-2372