Thickness Dependence of the Crystallization of Au/Glass Ultrathin Films

被引:1
|
作者
Cho, Tae-Sik [1 ]
Kim, Jin-Woo [2 ]
机构
[1] Kyungpook Natl Univ, Dept Nano Mat Engn, Sangju 742711, Kyungpook, South Korea
[2] GIST, Dept Mat Sci & Engn, Kwangju 787120231, South Korea
关键词
SPR Biosensor; Au/Glass Thin Films; Thickness Dependence; Crystallization; SURFACE-PLASMON RESONANCE; THIN-FILMS; GOLD; MICROSTRUCTURE; NANOPARTICLES; TIN;
D O I
10.1166/jnn.2013.7282
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The crystallization of Au/glass ultrathin films for surface plasmon resonance.(SPR) biosensor has been studied using synchrotron X-ray scattering and field emission scanning electron microscope. In films thinner than 30 nm, crystallized Au grains with [111] preferred orientation were formed in the as-deposited amorphous precursor. In film with 58-nm thickness, however, Au (200) powder grains existed on top of the Au (111)-oriented grains near the interface. At the annealing temperature of 400 degrees C, the Au (200) powder grains disappeared, while the Au (111)-oriented grains grew further. The behavior of the surface morphology of Au thin films post-annealed at 400 degrees C was consistent with the thickness dependence of the crystallization. In a 10-nm-thick film, the Au (111)-oriented grains fully crystallized, and then became separated with each other. By increasing to 30-nm film thickness, the Au (111)-oriented grains grew further, coalesced into large columnar-type grains, and showed smooth surface. We suggest that the appropriate thickness of Au/glass thin film for SPR biosensor need over 30-nm-thick, considering smooth surface.
引用
收藏
页码:3711 / 3714
页数:4
相关论文
共 50 条
  • [21] Thickness dependence of the surface plasmon dispersion in. ultrathin aluminum films on silicon
    Yu, Yinghui
    Tang, Zhe
    Jiang, Ying
    Wu, Kehui
    Wang, Enge
    SURFACE SCIENCE, 2006, 600 (22) : 4966 - 4971
  • [22] Dependence of the surface morphology of ultrathin bismuth films on mica substrates on the film thickness
    A. N. Krushelnitckii
    E. V. Demidov
    E. K. Ivanova
    N. S. Kablukova
    V. A. Komarov
    Semiconductors, 2017, 51 : 876 - 878
  • [23] Thickness dependence of infrared reflectance of ultrathin metallic films: Influence of quantum confinement
    Villagomez, Ricardo
    Xiao, Mufei
    OPTIK, 2016, 127 (15): : 5920 - 5927
  • [24] Dependence of the surface morphology of ultrathin bismuth films on mica substrates on the film thickness
    Krushelnitckii, A. N.
    Demidov, E. V.
    Ivanova, E. K.
    Kablukova, N. S.
    Komarov, V. A.
    SEMICONDUCTORS, 2017, 51 (07) : 876 - 878
  • [25] THICKNESS MEASUREMENTS OF ULTRATHIN FILMS
    BOUQUET, FL
    CARROLL, WF
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1979, 24 (06): : 800 - 800
  • [26] Ultrathin and Nanostructured Au Films with Gradient of Effective Thickness. Optical and Plasmonic Properties
    Tomilin, S. V.
    Berzhansky, V. N.
    Shaposhnikov, A. N.
    Prokopov, A. R.
    Milyukova, E. T.
    Karavaynikov, A. V.
    Tomilina, O. A.
    3RD INTERNATIONAL SCHOOL AND CONFERENCE ON OPTOELECTRONICS, PHOTONICS, ENGINEERING AND NANOSTRUCTURES (SAINT PETERSBURG OPEN 2016), 2016, 741
  • [27] THICKNESS DEPENDENCE OF BUCKLING PATTERNS OF Ta FILMS SPUTTERED ON GLASS SUBSTRATES
    Zhang, Yong-Ju
    Yu, Sen-Jiang
    Zhou, Hong
    Chen, Miao-Gen
    Jiao, Zhi-Wei
    SURFACE REVIEW AND LETTERS, 2012, 19 (03)
  • [28] Dependence of the glass transition temperature of polymer films on interfacial energy and thickness
    Fryer, DS
    Peters, RD
    Kim, EJ
    Tomaszewski, JE
    de Pablo, JJ
    Nealey, PF
    White, CC
    Wu, WL
    MACROMOLECULES, 2001, 34 (16) : 5627 - 5634
  • [29] TUNNELING IN ULTRATHIN GLASS FILMS
    LAIBOWITZ, RB
    ELDRIDGE, JM
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1969, 6 (04): : 714 - +
  • [30] Thickness dependence and crystallization properties of amorphous GeTe thin films on silicon dioxide
    Zhou, Zhengquan
    Wu, Weihua
    Li, Yu
    Zhai, Jiwei
    PHYSICA SCRIPTA, 2024, 99 (10)