Inherent growth habit of Cu6Sn5 phase at the liquid Sn0.7wt%Cu solder/(111)Cu joint interface

被引:0
|
作者
Cao, Huijun [1 ]
Zhang, Zhihao [2 ]
机构
[1] Xiamen City Univ, Sch Mech & Automat Engn, Xiamen, Peoples R China
[2] Xiamen Univ, Coll Mat, Xiamen, Peoples R China
来源
2016 17TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT) | 2016年
关键词
nanostructured intermetallics; crystallographic texture; crystal growth; relibility; phase stability; CU; EVOLUTION; SN;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Morphologies and growth habits of Cu6Sn5 formed at the liquid Sn0.7wt%Cu solder and (111)(Cu) single crystal joint interface were investigated in this study. The steady-state grain growth of Cu6Sn5 nanorods were observed in the internal liquid solder. Furthermore, the formations of the roof-type morphology of interfacial Cu6Sn5 phase were not only dependent upon the low lattice mismatch directions of Cu atoms between Cu6Sn5 and (111)(Cu), but also controlled by the inherent nanorods growth habit which was confirmed by our theoretical and experimental study. In addition, the side facets of Cu6Sn5 phase on the solder side were also analyzed. From the results, the {10 (1) over bar0} facets of the rod-type morphology is caused by the thermodynamic reason, while the {11 (2) over bar0} facets of the roof-type morphology is due to the kinetic reason.
引用
收藏
页码:352 / 355
页数:4
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