Multi-scale characterization of surface blistering morphology of helium irradiated W thin films

被引:2
作者
Yang, J. J. [1 ]
Zhu, H. L. [1 ]
Wan, Q. [2 ]
Peng, M. J. [1 ]
Ran, G. [3 ]
Tang, J. [1 ]
Yang, Y. Y. [1 ]
Liao, J. L. [1 ]
Liu, N. [1 ]
机构
[1] Sichuan Univ, Inst Nucl Sci & Technol, Minist Educ, Key Lab Radiat Phys & Technol, Chengdu 610064, Sichuan, Peoples R China
[2] China Acad Engn Phys, Inst Struct Mech, Mianyang 621900, Sichuan, Peoples R China
[3] Xiamen Univ, Sch Energy Res, Xiamen 361005, Fujian, Peoples R China
基金
中国国家自然科学基金;
关键词
Surface morphology; Irradiation; Thin film; Multi-scale; ION IRRADIATION; TUNGSTEN; STRESS;
D O I
10.1016/j.nimb.2015.06.010
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Surface blistering morphologies of W thin films irradiated by 30 keV He ion beam were studied quantitatively. It was found that the blistering morphology strongly depends on He fluence. For lower He fluence, the accumulation and growth of He bubbles induce the intrinsic surface blisters with mono-modal size distribution feature. When the He fluence is higher, the film surface morphology exhibits a multi-scale property, including two kinds of surface blisters with different characteristic sizes. In addition to the intrinsic He blisters, film/substrate interface delamination also induces large-sized surface blisters. A strategy based on wavelet transform approach was proposed to distinguish and extract the multi-scale surface blistering morphologies. Then the density, the lateral size and the height of these different blisters were estimated quantitatively, and the effect of He fluence on these geometrical parameters was investigated. Our method could provide a potential tool to describe the irradiation induced surface damage morphology with a multi-scale property. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码:124 / 130
页数:7
相关论文
共 30 条
[1]   Helium mobility in advanced nuclear ceramics [J].
Agarwal, S. ;
Trocellier, P. ;
Serruys, Y. ;
Vaubaillon, S. ;
Miro, S. .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2014, 327 :117-120
[2]  
Akansu AliN., 1992, Multiresolution Signal Decomposition : Transforms, Subbands, Wavelets
[3]   Texture classification using wavelet transform [J].
Arivazhagan, S ;
Ganesan, L .
PATTERN RECOGNITION LETTERS, 2003, 24 (9-10) :1513-1521
[4]   Wavelet based multifractal analysis of rough surfaces: Application to cloud models and satellite data [J].
Arrault, J ;
Arneodo, A ;
Davis, A ;
Marshak, A .
PHYSICAL REVIEW LETTERS, 1997, 79 (01) :75-78
[5]   Intrinsic anomalous surface roughening of TiN films deposited by reactive sputtering -: art. no. 045436 [J].
Auger, MA ;
Vázquez, L ;
Cuerno, R ;
Castro, M ;
Jergel, M ;
Sánchez, O .
PHYSICAL REVIEW B, 2006, 73 (04)
[6]   ROLE OF INTEGRATED LATERAL STRESS IN SURFACE DEFORMATION OF HE-IMPLANTED SURFACES [J].
EERNISSE, EP ;
PICRAUX, ST .
JOURNAL OF APPLIED PHYSICS, 1977, 48 (01) :9-17
[7]   Size dependent enhancement of helium ion irradiation tolerance in sputtered Cu/V nanolaminates [J].
Fu, E. G. ;
Carter, J. ;
Swadener, G. ;
Misra, A. ;
Shao, L. ;
Wang, H. ;
Zhang, X. .
JOURNAL OF NUCLEAR MATERIALS, 2009, 385 (03) :629-632
[8]   Helium retention and surface blistering characteristics of tungsten with regard to first wall conditions in an inertial fusion energy reactor [J].
Gilliam, SB ;
Gidcumb, SM ;
Forsythe, D ;
Parikh, NR ;
Hunn, JD ;
Snead, LL ;
Lamaze, GP .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2005, 241 (1-4) :491-495
[9]   Effects of morphology on the decohesion of compressed thin films [J].
He, MY ;
Evans, AG ;
Hutchinson, JW .
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1998, 245 (02) :168-181
[10]   Morphological assessment of in vivo wear of orthopaedic implants using multiscalar wavelets [J].
Jiang, XQ ;
Blunt, L .
WEAR, 2001, 250 (PART 1) :217-221