Investigation of defects generated in vertically oriented graphene

被引：51

作者：

Quinlan, Ronald A. ^{[1
,2
]}

Cai, Minzhen ^{[2
]}

Outlaw, Ronald A. ^{[2
]}

Butler, Sue M. ^{[3
,4
]}

Miller, John R. ^{[3
,4
]}

Mansour, Azzam N. ^{[1
]}

机构：

[1] Naval Surface Warfare Ctr Carderock, Mat & Power Syst Branch, West Bethesda, MD 20817 USA

[2] Coll William & Mary, Dept Appl Sci, Williamsburg, VA 23185 USA

[3] JME Capacitor Inc, Cleveland, OH 44106 USA

[4] Case Western Reserve, Great Lakes Energy Inst, Cleveland, OH 44106 USA

来源：

CARBON | 2013年 / 64卷

关键词：

X-RAY-ABSORPTION; WALLED CARBON NANOTUBES; FINE-STRUCTURE; PHOTOELECTRON-SPECTROSCOPY; GRAPHITE; OXYGEN; LAYER; NANOSHEETS; NEXAFS; XPS;

D O I：

10.1016/j.carbon.2013.07.040

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Vertically oriented graphene nanosheets are promising electrode materials for electrochemical double-layer capacitors. The external surface area of the nanosheets allows for extremely fast response times compared to porous carbon materials currently used. Furthermore, the high edge density increases the charge storage ability of the material. In this paper Ar+ ions were used to create a larger density of surface defects, which were then characterized by X-ray photoelectron spectroscopy and near-edge X-ray absorption fine structure spectroscopy. The results indicate a change in the density of states near the Fermi level with increased defect density, which suggests a corresponding increase in electrochemical capacitance capability. Published by Elsevier Ltd.

引用

页码：92 / 100

页数：9

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