An accurate measurement method of high permittivity materials by numerical analysis of coplanar waveguide

被引:0
|
作者
Tsuji, Masatoshi [1 ]
Nishikawa, Toshio [1 ]
Wakino, Kikuo [1 ]
Kitazawa, Toshihide [1 ]
机构
[1] Ritsumeikan Univ, Dept Elect & Elect Engn, Kusatsu, Japan
来源
2005 ASIA-PACIFIC MICROWAVE CONFERENCE PROCEEDINGS, VOLS 1-5 | 2005年
关键词
permittivity; BST; higher-order mode; coplanar waveguide; spectral domain approach;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An accurate and simple technique for evaluation of high permittivity materials, (Bs,Sr) TiO(3) (BST) ceramics, in the microwave region is developed with assistance of full-wave analysis of a coplanar waveguide (CPW). S-parameters of the CPW are measured from 0.5 to 40 GHz, and effective permittivity and attenuation constants at each frequency are obtained from the S-parameter data. Relative permittivity (epsilon(r)) and tan delta are evaluated by numerical calculations using the extended spectral domain approach taking the conductor thickness effect into consideration. The estimated epsilon(r)'s of Ba(0.7)Sr(0.3)TiO(3), Ba(0.5)Sr(0.5)TiO(3), and Ba(0.3)Sr(0.7)TiO(3) are 660, 1650, and 4450, respectively. The epsilon(r) decreases slightly as frequency increased due to dielectric dispersion. This technique enables the evaluation of even a small deviation in high permittivity materials.
引用
收藏
页码:2374 / 2377
页数:4
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