Spectroscopic and electrochemical characterization of the surface layers of chalcopyrite (CuFeS2) reacted in acidic solutions

被引:140
作者
Mikhlin, YL
Tomashevich, YV
Asanov, IP
Okotrub, AV
Varnek, VA
Vyalikh, DV
机构
[1] RAS, Inst Chem & Chem Technol, Lab Hydrometallury, Krasnoyarsk 660049, Russia
[2] Russian Acad Sci, Inst Inorgan Chem, Novosibirsk 630090, Russia
[3] Tech Univ Dresden, Inst Oberflachenphys & Mikrostrukturphys, D-01062 Dresden, Germany
基金
俄罗斯基础研究基金会;
关键词
chalcopyrite; oxidative leaching; X-ray photoelectron spectroscopy; X-ray emission; X-ray absorption spectroscopy; voltammetry;
D O I
10.1016/j.apsusc.2003.10.030
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
XPS, Fe Lalpha,beta and Cu Lalpha,beta X-ray emission and Fe L-, Cu L-, S L-edge and O K-edge absorption spectroscopies, Mossbauer spectroscopy and cyclic voltammetry were applied to study reacted surface layers of natural chalcopyrite, CuFeS2. The surfaces became metal-depleted after the anodic oxidation in 1 M HCl and the leaching in 1 M H2SO4 + 0.2 M Fe-2(SO4)(3) or 1 M HCl + 0.4 M FeCl3 solutions, with the sulfur excess and iron/copper ratio been higher in the last instance, and were enriched in copper after the electrochemical reduction. The electronic structures of the metal-deficient layers up to several tenths of micrometer thick were similar to that of chalcopyrite, except that the density of the highest occupied states depended on sulfur anions formed (predominant S-3-anions after the ferric sulfate treatment, S-4-anions after the ferric chloride leaching or the potential sweep to 0.9 V, etc.). The layers created by the preliminary oxidation had only a small effect on the chalcopyrite voltammetry. We suggest a new reaction mechanism considering a role of the surface changes, including disordering and Anderson localization of the electronic states. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:395 / 409
页数:15
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