In-situ SEM microchip setup for electrochemical experiments with water based solutions

被引:17
作者
Jensen, E. [1 ,2 ]
Kobler, C. [1 ,2 ]
Jensen, P. S. [3 ]
Molhave, K. [1 ]
机构
[1] Tech Univ Denmark, DTU Nanotech, DK-2800 Lyngby, Denmark
[2] Tech Univ Denmark, DTU CEN, DK-2800 Lyngby, Denmark
[3] Tech Univ Denmark, DTU Kemi, DK-2800 Lyngby, Denmark
关键词
SEM; In-situ SEM; Liquid state; Electroless deposition; Electrolysis; MONTE-CARLO-SIMULATION; SCANNING-ELECTRON-MICROSCOPE; LIQUID WATER; PROTON TRACKS; CELLS; GROWTH; RADIOLYSIS; CHEMISTRY; NANOPARTICLES; PLATINUM;
D O I
10.1016/j.ultramic.2013.03.002
中图分类号
TH742 [显微镜];
学科分类号
摘要
Studying electrochemical (EC) processes with electron microscopes offers the possibility of achieving much higher resolution imaging of nanoscale processes in real time than with optical microscopes. We have developed a vacuum sealed liquid sample electrochemical cell with electron transparent windows, microelectrodes and an electrochemical reference electrode. The system, called the EC-SEM Cell, is used to study electrochemical reactions in liquid with a standard scanning electron microscope (SEM). The central component is a microfabricated chip with a thin (50 nm) Si-rich silicon nitride (SiNx) window with lithographically defined platinum microelectrodes. We show here the design principles of the EC-SEM system, its detailed construction and how it has been used to perform a range of EC experiments, two of which are presented here. It is shown that the EC-SEM Cell can survive extended in-situ EC experiments. Before the EC experiments we characterized the beam current being deposited in the liquid as this will affect the experiments. The first EC experiment shows the influence of the electron-beam (e-beam) on a nickel solution by inducing electroless nickel deposition on the window when increasing the current density from the e-beam. The second experiment shows electrolysis in EC-SEM Cell, induced by the built-in electrodes. (C) 2013 Elsevier B.V. All rights reserved.
引用
收藏
页码:63 / 69
页数:7
相关论文
共 46 条
[1]   Atomic force microscopy study of electron beam written contamination structures [J].
Amman, M ;
Sleight, JW ;
Lombardi, DR ;
Welser, RE ;
Deshpande, MR ;
Reed, MA ;
Guido, LJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (01) :54-62
[2]  
Atkins P., 2002, ATKINS ELEMENTS PHYS
[3]   A history of scanning electron microscopy developments: Towards "wet-STEM" imaging [J].
Bogner, A. ;
Jouneau, P. -H. ;
Thollet, G. ;
Basset, D. ;
Gauthier, C. .
MICRON, 2007, 38 (04) :390-401
[4]   Monte Carlo simulation of fast electron and proton tracks in liquid water - I. Physical and physicochemical aspects [J].
Cobut, V ;
Frongillo, Y ;
Patau, JP ;
Goulet, T ;
Fraser, MJ ;
Jay-Gerin, JP .
RADIATION PHYSICS AND CHEMISTRY, 1998, 51 (03) :229-243
[5]   A MEMS Reactor for Atomic-Scale Microscopy of Nanomaterials Under Industrially Relevant Conditions [J].
Creemer, J. Fredrik ;
Helveg, Stig ;
Kooyman, Patricia J. ;
Molenbroek, Alfons M. ;
Zandbergen, Henny W. ;
Sarro, Pasqualina M. .
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2010, 19 (02) :254-264
[6]  
de Jonge N, 2011, NAT NANOTECHNOL, V6, P695, DOI [10.1038/NNANO.2011.161, 10.1038/nnano.2011.161]
[7]   Nanometer-resolution electron microscopy through micrometers-thick water layers [J].
de Jonge, Niels ;
Poirier-Demers, Nicolas ;
Demers, Hendrix ;
Peckys, Diana B. ;
Drouin, Dominique .
ULTRAMICROSCOPY, 2010, 110 (09) :1114-1119
[8]   A possible water calorimeter based on radiation-induced conductivity [J].
Dombeck, TW .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2003, 50 (04) :1153-1160
[9]   Liquid-precursor electron-beam-induced deposition of Pt nanostructures: dose, proximity, resolution [J].
Donev, E. U. ;
Hastings, J. T. .
NANOTECHNOLOGY, 2009, 20 (50)
[10]   Substrate effects on the electron-beam-induced deposition of platinum from a liquid precursor [J].
Donev, Eugenii U. ;
Schardein, Gregory ;
Wright, John C. ;
Hastings, J. Todd .
NANOSCALE, 2011, 3 (07) :2709-2717