Advanced atomic force microscopies and their applications in two-dimensional materials: a review

被引：34
作者：
Xu, Rui [1 ]
Guo, Jianfeng [1 ]
Mi, Shuo [1 ]
Wen, Huanfei [2 ,3 ]
Pang, Fei [1 ]
Ji, Wei [1 ]
Cheng, Zhihai [1 ]
机构：
[1] Renmin Univ China, Dept Phys, Beijing Key Lab Optoelect Funct Mat & Micronano De, Beijing 100872, Peoples R China
[2] North Univ China, Key Lab Instrument Sci & Dynam Testing, Taiyuan 030051, Peoples R China
[3] North Univ China, Inst Instrument & Elect, Key Lab Quantum Sensing & Precis Measurement, Taiyuan 030051, Peoples R China
来源：
MATERIALS FUTURES | 2022年 / 1卷 / 03期
基金：
中国国家自然科学基金;
关键词：
atomic force microscopy; advanced atomic force microscopy; two-dimensional materials; surface and interface; SCANNING THERMAL MICROSCOPY; ORGANIC SEMICONDUCTOR; MONOLAYER MOS2; SURFACE; METAL; RESOLUTION; IDENTIFICATION; TRANSITION; INHOMOGENEITY; CONDUCTIVITY;
D O I：
10.1088/2752-5724/ac8aba
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Scanning probe microscopy (SPM) allows the spatial imaging, measurement, and manipulation of nano and atomic scale surfaces in real space. In the last two decades, numerous advanced and functional SPM methods, particularly atomic force microscopy (AFM), have been developed and applied in various research fields, from mapping sample morphology to measuring physical properties. Herein, we review the recent progress in functional AFM methods and their applications in studies of two-dimensional (2D) materials, particularly their interfacial physical properties on the substrates. This review can inspire more exciting application works using advanced AFM modes in the 2D and functional materials fields.
引用
收藏
页数：39
相关论文
共 201 条
  • [1] Strain-engineered growth of two-dimensional materials
    Ahn, Geun Ho
    Amani, Matin
    Rasool, Haider
    Lien, Der-Hsien
    Mastandrea, James P.
    Ager, Joel W., III
    Dubey, Madan
    Chrzan, Daryl C.
    Minor, Andrew M.
    Javey, Ali
    [J]. NATURE COMMUNICATIONS, 2017, 8
  • [2] Scanning thermal imaging of microelectronic circuits with a fluorescent nanoprobe
    Aigouy, L
    Tessier, G
    Mortier, M
    Charlot, B
    [J]. APPLIED PHYSICS LETTERS, 2005, 87 (18) : 1 - 3
  • [3] AC thermal imaging of a microwire with a fluorescent nanocrystal: Influence of the near field on the thermal contrast
    Aigouy, Lionel
    Saidi, Elika
    Lalouat, Loic
    Labeguerie-Egea, Jessica
    Mortier, Michel
    Loew, Peter
    Bergaud, Christian
    [J]. JOURNAL OF APPLIED PHYSICS, 2009, 106 (07)
  • [4] Al Balushi ZY, 2016, NAT MATER, V15, P1166, DOI [10.1038/NMAT4742, 10.1038/nmat4742]
  • [5] FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY
    ALBRECHT, TR
    GRUTTER, P
    HORNE, D
    RUGAR, D
    [J]. JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) : 668 - 673
  • [6] Nanoscale microwave imaging with a single electron spin in diamond
    Appel, Patrick
    Ganzhorn, Marc
    Neu, Elke
    Maletinsky, Patrick
    [J]. NEW JOURNAL OF PHYSICS, 2015, 17
  • [7] Nanoscale electrical conductivity imaging using a nitrogen-vacancy center in diamond
    Ariyaratne, Amila
    Bluvstein, Dolev
    Myers, Bryan A.
    Jayich, Ania C. Bleszynski
    [J]. NATURE COMMUNICATIONS, 2018, 9
  • [8] Microwave impedance microscopy and its application to quantum materials
    Barber, Mark E.
    Ma, Eric Yue
    Shen, Zhi-Xun
    [J]. NATURE REVIEWS PHYSICS, 2022, 4 (01) : 61 - 74
  • [9] A Review of Three-Dimensional Scanning Near-Field Optical Microscopy (3D-SNOM) and Its Applications in Nanoscale Light Management
    Bazylewski, Paul
    Ezugwu, Sabastine
    Fanchini, Giovanni
    [J]. APPLIED SCIENCES-BASEL, 2017, 7 (10):
  • [10] Heterointerface effects in the electrointercalation of van der Waals heterostructures
    Bediako, D. Kwabena
    Rezaee, Mehdi
    Yoo, Hyobin
    Larson, Daniel T.
    Zhao, S. Y. Frank
    Taniguchi, Takashi
    Watanabe, Kenji
    Brower-Thomas, Tina L.
    Kaxiras, Efthimios
    Kim, Philip
    [J]. NATURE, 2018, 558 (7710) : 425 - +
12345678910