Advanced atomic force microscopies and their applications in two-dimensional materials: a review

被引：40

作者：

Xu, Rui ^{[1
]}

Guo, Jianfeng ^{[1
]}

Mi, Shuo ^{[1
]}

Wen, Huanfei ^{[2
,3
]}

Pang, Fei ^{[1
]}

Ji, Wei ^{[1
]}

Cheng, Zhihai ^{[1
]}

机构：

[1] Renmin Univ China, Dept Phys, Beijing Key Lab Optoelect Funct Mat & Micronano De, Beijing 100872, Peoples R China

[2] North Univ China, Key Lab Instrument Sci & Dynam Testing, Taiyuan 030051, Peoples R China

[3] North Univ China, Inst Instrument & Elect, Key Lab Quantum Sensing & Precis Measurement, Taiyuan 030051, Peoples R China

来源：

MATERIALS FUTURES | 2022年 / 1卷 / 03期

基金：

中国国家自然科学基金;

关键词：

atomic force microscopy; advanced atomic force microscopy; two-dimensional materials; surface and interface; SCANNING THERMAL MICROSCOPY; ORGANIC SEMICONDUCTOR; MONOLAYER MOS2; SURFACE; METAL; RESOLUTION; IDENTIFICATION; TRANSITION; INHOMOGENEITY; CONDUCTIVITY;

D O I：

10.1088/2752-5724/ac8aba

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Scanning probe microscopy (SPM) allows the spatial imaging, measurement, and manipulation of nano and atomic scale surfaces in real space. In the last two decades, numerous advanced and functional SPM methods, particularly atomic force microscopy (AFM), have been developed and applied in various research fields, from mapping sample morphology to measuring physical properties. Herein, we review the recent progress in functional AFM methods and their applications in studies of two-dimensional (2D) materials, particularly their interfacial physical properties on the substrates. This review can inspire more exciting application works using advanced AFM modes in the 2D and functional materials fields.

引用

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