Detection mechanism for ferroelectric domain boundaries with lateral force microscopy

被引：36

作者：

Jungk, Tobias ^{[1
]}

Hoffmann, Akos ^{[1
]}

Soergel, Elisabeth ^{[1
]}

机构：

[1] Univ Bonn, Inst Phys, D-53115 Bonn, Germany

来源：

APPLIED PHYSICS LETTERS | 2006年 / 89卷 / 04期

关键词：

D O I：

10.1063/1.2234303

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The contrast mechanism for the visualization of ferroelectric domain boundaries with lateral force microscopy is generally assumed to be caused by mechanical deformation of the sample due to the converse piezoelectric effect. We show, however, that electrostatic interactions between the charged tip and the electric fields arising from the surface polarization charges dominate the contrast mechanism. This explanation is sustained by quantitative analysis of the measured forces as well as by comparative measurements on lithium niobate and potassium titanyl phosphate. (c) 2006 American Institute of Physics.

引用

页数：3

共 18 条

[1]

Alexe M., 2004, NANOSCALE CHARACTERI

[2] High-resolution domain imaging on the nonpolar y-face of periodically poled KTiOPO4 by means of atomic force microscopy [J].