Wood stiffness by x-ray diffractometry

被引:107
作者
Evans, Robert [1 ]
机构
[1] CSIRO, Forestry & Forest Prod, Clayton, Vic 3169, Australia
来源
Characterization of the Cellulosic Cell Wall | 2006年
关键词
x-ray diffraction; microfibril angle; modeling wood properties; longitudinal modulus of elasticity; SilviScan-2;
D O I
10.1002/9780470999714.ch11
中图分类号
TB3 [工程材料学]; TS [轻工业、手工业、生活服务业];
学科分类号
0805 ; 080502 ; 0822 ;
摘要
As a first approximation, wood can be modeled as a two-phase composite material consisting of load-bearing, highly crystalline S-2 cellulose microfibrils and relatively non-load-bearing "matrix" material including lignin, hemicelluloses, amorphous cellulose, and crystalline cellulose in microfibrils oriented well away from the fiber axis (in the S-1 and S-3 wall layers). A new rapid X-ray diffractometric method, based on this concept, is proposed for estimating the longitudinal stiffness of wood in increment cores by X-ray diffractometry. The method does not involve the estimation of microfibril angle, although this property is indirectly taken into account. X-ray diffractometry allows a crude separation of these two phases to yield a simple wood stiffness model that appears to apply to a wide range of species without further calibration.
引用
收藏
页码:138 / 146
页数:9
相关论文
共 50 条
[21]   X-ray diffracfion study of pine wood treated with NaOH [J].
Borysiak, S ;
Doczekalska, B .
FIBRES & TEXTILES IN EASTERN EUROPE, 2005, 13 (05) :87-89
[22]   Estimation of Drug Particle Size in Intact Tablets by 2-Dimensional X-Ray Diffractometry [J].
Thakral, Seema ;
Thakral, Naveen K. ;
Suryanarayanan, Raj .
JOURNAL OF PHARMACEUTICAL SCIENCES, 2018, 107 (01) :231-238
[23]   Experimental quantification of the austenitic phase in steels using the Average peak method of x-ray diffractometry [J].
Piesova, Marianna ;
Czan, Andrej ;
Sajgalik, Michal ;
Czanova, Tatiana ;
Cep, Robert .
12TH INTERNATIONAL SCIENTIFIC CONFERENCE OF YOUNG SCIENTISTS ON SUSTAINABLE, MODERN AND SAFE TRANSPORT, 2017, 192 :689-694
[24]   High-resolution X-ray diffraction imaging of non-Bragg diffracting materials using phase retrieval X-ray diffractometry (PRXRD) technique [J].
Nikulin, AY ;
Darahanau, AV ;
Horney, R ;
Ishikawa, T .
PHYSICA B-CONDENSED MATTER, 2004, 349 (1-4) :281-295
[25]   On the use of polycapillary structures to improve laboratory Energy-Dispersive X-ray Diffractometry and Reflectometry [J].
Albertini, V. Rossi ;
Paci, B. ;
Generosi, A. ;
Dabagov, S. B. ;
Mikhin, O. ;
Kumakhov, M. A. .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2007, 62 (11) :1203-1207
[26]   Application of X-ray diffraction to assess the microfibril angle of green and dry Eucalyptus grandis wood [J].
Marques de Souza, Naiara Conceicao ;
Lima, Jose Tarcisio ;
Dias Soares, Bruno Charles .
TREES-STRUCTURE AND FUNCTION, 2022, 36 (01) :191-197
[27]   Application of X-ray diffraction to assess the microfibril angle of green and dry Eucalyptus grandis wood [J].
Naiara Conceição Marques de Souza ;
José Tarcísio Lima ;
Bruno Charles Dias Soares .
Trees, 2022, 36 :191-197
[28]   HIGH-RESOLUTION X-RAY TRIPLE AXIS DIFFRACTOMETRY OF SHORT-PERIOD SIMGEN SUPERLATTICES [J].
KOPPENSTEINER, E ;
BAUER, G ;
HOLY, V ;
KASPER, E .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (4B) :2322-2328
[29]   Anisotropy of elastic deformations in multilayer (In,Ga)As/GaAs structures with quantum wires: X-ray diffractometry study [J].
Strelchuk, V. V. ;
Kladko, V. P. ;
Yefanov, O. M. ;
Kolomys, O. F. ;
Gudymenko, O., I ;
Valakh, M. Ya ;
Mazur, Yu, I ;
Wang, Z. M. ;
Salamo, G. J. .
SEMICONDUCTOR PHYSICS QUANTUM ELECTRONICS & OPTOELECTRONICS, 2005, 8 (01) :36-45
[30]   Discriminating between two chiral diastereoisomeric 7-oxanitronorbornenes by conventional X-ray powder diffractometry [J].
Cumbrera, Francisco L. ;
Ortiz, Angel L. ;
Araujo, Noelia ;
Gil, Maria V. ;
Roman, Emilio ;
Serrano, Jose A. .
ZEITSCHRIFT FUR KRISTALLOGRAPHIE-CRYSTALLINE MATERIALS, 2010, 225 (10) :434-439