Polarization-dependent hard X-ray photoemission spectroscopy of solids

被引：17

作者：

Sekiyama, Akira ^{[1
,2
]}

Higashiya, Atsushi ^{[2
,3
]}

Imada, Shin ^{[4
]}

机构：

[1] Osaka Univ, Grad Sch Engn Sci, Div Mat Phys, Toyonaka, Osaka 5608531, Japan

[2] SPring 8 RIKEN, Sayo, Hyogo 6795148, Japan

[3] Setsunan Univ, Fac Sci & Engn, Neyagawa, Osaka 5728508, Japan

[4] Ritsumeikan Univ, Dept Phys Sci, Kusatsu, Shiga 5258577, Japan

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 2013年 / 190卷

关键词：

Hard X-ray photoemission; Polarization; Synchrotron radiation; Linear dichroism; Electronic structure; Photoelectron angular distribution; PHOTOELECTRON ANGULAR-DISTRIBUTION; DISTRIBUTION PARAMETERS;

D O I：

10.1016/j.elspec.2013.08.008

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

We have developed a linear polarization-dependent hard X-ray photoemission (HAXPES) measurement system, by which the orbital contribution in the valence bands as well as the conduction electrons in solids can be revealed. Our experimental set up, recent progress and a few examples of the linear polarization dependence of HAXPES spectra are shown. It is also shown that the polarization dependence of the core-level spectra is fairly explained by theoretical calculations of photoelectron angular distributions for single atoms. (C) 2013 Elsevier B.V. All rights reserved.

引用

页码：201 / 204

页数：4

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