Material degradation of liquid organic semiconductors analyzed by nuclear magnetic resonance spectroscopy

被引:8
作者
Fukushima, Tatsuya [1 ]
Yamamoto, Junichi [1 ]
Fukuchi, Masashi [1 ]
Hirata, Shuzo [2 ]
Jung, Heo Hyo [2 ]
Hirata, Osamu [3 ]
Shibano, Yuki [3 ]
Adachi, Chihaya [2 ]
Kaji, Hironori [1 ]
机构
[1] Kyoto Univ, Inst Chem Res, Kyoto 6110011, Japan
[2] Kyushu Univ, Ctr Organ Photon & Elect Res OPERA, Nishi, Fukuoka 8190395, Japan
[3] Nissan Chem Ind Co Ltd, Funabashi, Chiba 2748507, Japan
基金
日本学术振兴会;
关键词
LIGHT-EMITTING-DIODES; SMALL-MOLECULE; MECHANISM; DEVICES;
D O I
10.1063/1.4928515
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Liquid organic light-emitting diodes (liquid OLEDs) are unique devices consisting only of liquid organic semiconductors in the active layer, and the device performances have been investigated recently. However, the device degradation, especially, the origin has been unknown. In this study, we show that material degradation occurs in liquid OLEDs, whose active layer is composed of carbazole with an ethylene glycol chain. Nuclear magnetic resonance (NMR) experiments clearly exhibit that the dimerization reaction of carbazole moiety occurs in the liquid OLEDs during driving the devices. In contrast, cleavages of the ethylene glycol chain are not detected within experimental error. The dimerization reaction is considered to be related to the device degradation. (C) 2015 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License.
引用
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页数:5
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