Experiences with Commissioning Testing of HV & EHV Cable Systems: The Influence of Voltage Level and Duration for Identifying Life Limiting Defects

被引:0
作者
Fenger, M. [1 ]
机构
[1] Kinectrics Inc, Toronto, ON M8Z 6C4, Canada
来源
CONFERENCE RECORD OF THE 2012 IEEE INTERNATIONAL SYMPOSIUM ON ELECTRICAL INSULATION (ISEI) | 2012年
关键词
PARTIAL DISCHARGE;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Over the last decade and a half, thousands of kilometres of installed XLPE HV and EHV cable systems have been subjected to after-laying commissioning testing prior to energization. The commissioning test usually consists of a combination of AC HiPot & Partial Discharge (PD) testing. PD testing, in particular, has gained acceptance as a valid diagnostic tool for condition assessment of cable insulation. It is well known and understood that the results obtained from a partial discharge test depend not only on the conditions under which the test was performed but also on the test equipment itself including the type of sensor used and its location. Relying on experienced gained with AC Withstand and PD commissioning testing of more than 2,100 km of HV & EHV cable systems the paper examines the influence of voltage source and withstand duration of the withstand test for successfully identifying life limiting defects in newly laid HV & EHV Cable systems both in terms of breakdown and also in terms of detection of partial discharge sources from the same defects. The paper further provides statistical summary of tests performed on more than 2100 km of HV and EHV cable systems including failure rates of accessories and PD occurrence rates. The paper also provides several case studies of PD detected in cable accessories during AC HiPot commissioning testing.
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收藏
页码:242 / 249
页数:8
相关论文
共 13 条
  • [1] [Anonymous], 2008, 60270 IEC
  • [2] Fundamentals of partial discharge in the context of field cable testing
    Boggs, S
    Densley, J
    [J]. IEEE ELECTRICAL INSULATION MAGAZINE, 2000, 16 (05) : 13 - 18
  • [3] Contin A., 2000, IEEE INT S EL INS AN, P501
  • [4] Dissado L.A., IEE PUBLICATIONS
  • [5] Fenger M., 2008, P 2008 ISEI
  • [6] Fenger M., 2007, P 2007 JICABLE C
  • [7] Fenger M., 2012, P 2012 ISEI
  • [8] Investigation of partial discharge pulse shapes occurring at interfaces in model joints
    Nadolny, Z
    Braun, JM
    Densley, RJ
    [J]. PROCEEDINGS OF THE 1998 IEEE INTERNATIONAL CONFERENCE ON CONDUCTION AND BREAKDOWN IN SOLID DIELECTRICS - ICSD '98, 1998, : 119 - 122
  • [9] Partial discharge pulse propagation in shielded power cable and implications for detection sensitivity
    Oussalah, Naima
    Zebboudj, Youcef
    Boggs, Steven A.
    [J]. IEEE ELECTRICAL INSULATION MAGAZINE, 2007, 23 (06) : 5 - 10
  • [10] Pedersen, 1994, GASEOUS DIELECTRICS