A method for the thermal conductivity measurement of semiconductors

被引：4
|
作者：
Vahanyan, AI [1 ]
机构：
[1] Yerevan State Univ, Dept Phys Semicond & Microelect, Yerevan 375025, Armenia
来源：
MEASUREMENT | 2006年 / 39卷 / 05期
关键词：
thermal conductivity; semiconductors;
D O I：
10.1016/j.measurement.2005.11.022
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A stationary absolute method for the thermal conductivity measurement of semiconductor materials is developed. Accuracy and reproducibility of the method is provided with the strict account of thermal losses and temperature drops in the contacts' regions. (C) 2005 Elsevier Ltd. All rights reserved.
引用
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页码：447 / 450
页数：4
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