A new method to determine the size distribution of nanocrystalline grains and its application

被引：3

作者：

Gu, TS ^{[1
]}

Shi, SS ^{[1
]}

Lin, GM ^{[1
]}

机构：

[1] Zhongshan Univ, Dept Phys, Guangzhou 510275, Peoples R China

来源：

ACTA PHYSICA SINICA | 1999年 / 48卷 / 02期

关键词：

D O I：

10.7498/aps.48.267

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

A new method, Profile-fitting of X-ray diffraction spectroscopy (PFXDS) method, which was adopted to determine the size distribution of nanocrystalline grains, was introduced in this paper. Its theoretical model and basic hypothesis were clearly interpreted and its advantages and disadvantages were discussed in details. The PFXDS method was applied to the size distribution calculation of nano-SnO2 powder produced by sol-gel technology and the relatively ideal results were obtained.

引用

页码：267 / 272

页数：6