High-speed graded-channel AlGaN/GaN HEMTs with power added efficiency >70% at 30 GHz

被引:27
作者
Moon, J. S. [1 ]
Grabar, R. [1 ]
Wong, J. [1 ]
Antcliffe, M. [1 ]
Chen, P. [1 ]
Arkun, E. [1 ]
Khalaf, I. [1 ]
Corrion, A. [1 ]
Chappell, J. [1 ]
Venkatesan, N. [2 ]
Fay, P. [1 ]
机构
[1] HRL Lab LLC, 3011 Malibu Canyon Rd, Malibu, CA 90265 USA
[2] Univ Notre Dame, Notre Dame, IN 46556 USA
关键词
power measurement; aluminium compounds; wide band gap semiconductors; gallium compounds; high electron mobility transistors; III-V semiconductors; microwave field effect transistors; millimetre wave field effect transistors; semiconductor device measurement; power added efficiency; PAE; two-tone power measurement; novel channel design; high-speed graded-channel HEMTs; high-efficiency millimetre-wave power amplifiers; RF power density operation; size; 60; 0; nm; voltage; 10; V; frequency; 30; GHz; 14; efficiency; 75; percent; 65; AlGaN-GaN; PERFORMANCE; TRANSISTORS; GANHEMTS; GATE;
D O I
10.1049/el.2020.0281
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The authors report on highly scaled 60 nm gate length graded-channel AlGaN/GaN high electron mobility transistors (HEMTs) with a record power added efficiency (PAE) of 75% at 2.1 W/mm power density at Vdd = 10 V and the PAE of 65% at 3.0 W/mm power density at 30 GHz at Vdd = 14 V. Under two-tone power measurement, the graded-channel AlGaN/GaN HEMTs demonstrated similar power performance with peak PAE >70% at 30 GHz. This novel channel design shows great promise for high-efficiency millimetre-wave (mmW) power amplifiers up to 3 W/mm RF power density operation.
引用
收藏
页码:678 / 679
页数:2
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