Holographic Metrology and Basic Physics

被引:1
|
作者
Abramson, Nils H. [1 ]
机构
[1] Royal Inst Technol, S-10044 Stockholm, Sweden
关键词
Gated viewing; ultrashort pulses; holography; optical resolution; interferometry; relativity; duality of light; DIAGRAM;
D O I
10.1088/1742-6596/415/1/012030
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A short pulse of light is emitted from one point followed by a short observation from another point separated in space and time from the first. Even if space is full of scattering particles no sphere of expanding light is seen from outside by the observer, instead he finds himself inside an ellipsoid of light. We use this ellipsoid for measurement and in a graphic way to explain and evaluate optical resolution, gated viewing, radar, holography, 3-D interferometry and Special Relativity. In the later case the Lorentz Contraction together with the Time Dilation are explained as results of the eccentricity of the measuring ellipsoid, caused by its velocity. Finally, the extremely thin ellipsoid of the very first light appears as a beam aimed directly at the observer which might explain the wave or ray duality of light and entanglement.
引用
收藏
页数:7
相关论文
共 50 条
  • [1] Atomic frequency standards: Basic physics and impact on metrology
    Vanier, J
    RECENT ADVANCES IN METROLOGY AND FUNDAMENTAL CONSTANTS, 2001, 146 : 397 - 452
  • [2] Holographic microantenna array metrology
    Grossman, EN
    Luukanen, A
    Miller, AJ
    Passive Millimeter-Wave Imaging Technology VIII, 2005, 5789 : 44 - 50
  • [3] The physics of metrology instruments
    Davidson, M
    Vladar, AE
    SOLID STATE TECHNOLOGY, 1998, 41 (06) : 135 - +
  • [4] Physics of metrology instruments
    Spectel Co, Mountain View, United States
    Solid State Technol, 6
  • [5] Physics, metrology and development
    Berry, KH
    PHYSICA SCRIPTA, 2002, T97 : 126 - 130
  • [6] Metrology in physics and chemistry
    Valcárcel, M
    Rios, A
    ACCREDITATION AND QUALITY ASSURANCE, 2000, 5 (05) : 206 - 207
  • [7] SYMPOSIUM ON METROLOGY IN PHYSICS
    不详
    PTB-MITTEILUNGEN, 1987, 97 (06): : 481 - 481
  • [8] Metrology and the logic of physics
    Leschiutta, S
    RECENT ADVANCES IN METROLOGY AND FUNDAMENTAL CONSTANTS, 2001, 146 : 51 - 71
  • [9] Metrology in physics and chemistry
    Miguel Valcárcel
    A. Rios
    Accreditation and Quality Assurance, 2000, 5 : 206 - 207
  • [10] Basic metrology for 2020
    Davis, Richard
    Schlamminger, Stephan
    IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE, 2020, 23 (03) : 10 - 20