Thickness dependent electronic structure of La0.6Sr0.4MnO3 layer in SrTiO3/La0.6Sr0.4MnO3/SrTiO3 heterostructures studied by hard x-ray photoemission spectroscopy

被引：14
作者：
Yoshimatsu, K. [1 ]
Horiba, K. [1 ,2 ,3 ]
Kumigashira, H. [1 ,2 ,3 ]
Ikenaga, E. [4 ]
Oshima, M. [1 ,2 ,3 ]
机构：
[1] Univ Tokyo, Dept Appl Chem, Bunkyo Ku, Tokyo 1138656, Japan
[2] Japan Sci & Technol Agcy, CREST, Bunkyo Ku, Tokyo 1138656, Japan
[3] Univ Tokyo, Synchrotron Radiat Res Org, Bunkyo Ku, Tokyo 1138656, Japan
[4] JASRI Spring 8, Mikazuki, Hyogo 6795198, Japan
来源：
APPLIED PHYSICS LETTERS | 2009年 / 94卷 / 07期
基金：
日本学术振兴会;
关键词：
band structure; Fermi level; lanthanum compounds; metal-insulator transition; multilayers; strontium compounds; X-ray photoelectron spectra; MAGNETIC-PROPERTIES; SUPERLATTICES; INTERFACE;
D O I：
10.1063/1.3081016
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The authors have investigated changes in the electronic structures of digitally controlled La0.6Sr0.4MnO3 (LSMO) layers sandwiched between SrTiO3 as a function of LSMO layer thickness in terms of hard x-ray photoemission spectroscopy (HX-PES). The HX-PES spectra show the evolution of Mn 3d derived states near the Fermi level and the occurrence of metal-insulator transition at 8 ML. The detailed analysis for the thickness dependent HX-PES spectra reveals the existence of the less conducting and nonmagnetic transition layer with a film thickness of about 4 ML in the interface region owing to significant interaction through the interface.
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页数：3
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