Comparison of spectral indices and wavelet transform for estimating chlorophyll content of maize from hyperspectral reflectance

被引:21
|
作者
Liao, Qinhong [1 ,2 ]
Wang, Jihua [2 ]
Yang, Guijun [2 ]
Zhang, Dongyan [2 ]
Li, Heli [2 ]
Fu, Yuanyuan [1 ,2 ]
Li, Zhenhai [1 ,2 ]
机构
[1] Zhejiang Univ, Coll Environm & Nat Resources, Hangzhou 310058, Zhejiang, Peoples R China
[2] Natl Engn Res Ctr Informat Technol Agr, Beijing 100097, Peoples R China
来源
基金
中国国家自然科学基金; 中国博士后科学基金;
关键词
maize; chlorophyll content; spectral indices; wavelet transform; hyperspectral reflectance; REMOTE ESTIMATION; RED EDGE; LEAF; CAROTENOIDS; WAVEBANDS; PIGMENTS; NITROGEN; LEAVES; RANGE;
D O I
10.1117/1.JRS.7.073575
中图分类号
X [环境科学、安全科学];
学科分类号
08 ; 0830 ;
摘要
Chlorophyll is essential to plant photosynthesis, and chlorophyll content is an important indicator of a plant's growth status. During the past few decades, various types of spectral indices have been used to estimate chlorophyll content. Here we used a continuous wavelet transform (CWT) to estimate the chlorophyll content of maize leaves in different layers from visible to near-infrared (400 to 1000 nm) spectra. The dataset comprised 186 spectra from three leaf layers of plants under different nitrogen treatments. To identify the most sensitive wavelet features, wavelet power scalograms were generated by the CWT, then linear regression models were established between the wavelet power coefficients and chlorophyll content. Two individual wavelet features in the red-edge region were chosen for estimating the chlorophyll content of middle and lower layer, and all their determination coefficients (R-2) were better than the spectral indices. For the whole dataset, the most sensitive wavelet feature (724 nm, scale 4) was located near the red edge position, with better correlation (R-2 = 90.50%) than the best spectral index (R-2 = 81.85%). All the predicted models showed good consistency between the calibration and validation datasets, indicating that the chlorophyll content of different maize leaf layers can be accurately estimated by use of a CWT. (C) 2013 Society of Photo-Optical Instrumentation Engineers (SPIE) [DOI: 10.1117/1.JRS.7.073575]
引用
收藏
页数:11
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