Bragg x-ray ptychography of a silicon crystal: Visualization of the dislocation strain field and the production of a vortex beam

被引：80

作者：

Takahashi, Yukio ^{[1
]}

Suzuki, Akihiro ^{[1
]}

Furutaku, Shin ^{[1
]}

Yamauchi, Kazuto ^{[1
]}

Kohmura, Yoshiki ^{[2
]}

Ishikawa, Tetsuya ^{[2
]}

机构：

[1] Osaka Univ, Grad Sch Engn, Suita, Osaka 5650871, Japan

[2] RIKEN SPring 8 Ctr, Sayo, Hyogo 6795148, Japan

来源：

PHYSICAL REVIEW B | 2013年 / 87卷 / 12期

关键词：

ORBITAL ANGULAR-MOMENTUM; MICROSCOPY;

D O I：

10.1103/PhysRevB.87.121201

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We experimentally demonstrate the visualization of nanoscale dislocation strain fields in a thick silicon single crystal by a coherent diffraction imaging technique called Bragg x-ray ptychography. We also propose that the x-ray microbeam carrying orbital angular momentum is selectively produced by coherent Bragg diffraction from dislocation singularities in crystals. This work not only provides us with a tool for characterizing dislocation strain fields buried within extended crystals but also opens up new scientific opportunities in femtosecond spectroscopy using x-ray free-electron lasers. DOI: 10.1103/PhysRevB.87.121201

引用

页数：4

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