Geometrical dependence of the low-frequency noise in superconducting flux qubits

被引：59

作者：

Lanting, T. ^{[1
]}

Berkley, A. J. ^{[1
]}

Bumble, B. ^{[2
]}

Bunyk, P. ^{[1
]}

Fung, A. ^{[2
]}

Johansson, J. ^{[1
]}

Kaul, A. ^{[2
]}

Kleinsasser, A. ^{[1
]}

Ladizinsky, E. ^{[1
]}

Maibaum, F. ^{[1
]}

Harris, R. ^{[1
]}

Johnson, M. W. ^{[1
]}

Tolkacheva, E. ^{[1
]}

Amin, M. H. S. ^{[1
]}

机构：

[1] D Wave Syst Inc, Burnaby, BC V5C 6G9, Canada

[2] CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA

来源：

PHYSICAL REVIEW B | 2009年 / 79卷 / 06期

关键词：

Josephson effect; quantum computing; SQUIDs; superconducting device noise; DC SQUIDS;

D O I：

10.1103/PhysRevB.79.060509

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A general method for directly measuring the low-frequency flux noise (below 10 Hz) in compound Josephson-junction superconducting flux qubits has been used to study a series of 85 devices of varying design. The variation in flux noise across sets of qubits with identical designs was observed to be small. However, the levels of flux noise systematically varied between qubit designs with strong dependence upon qubit wiring length and wiring width. Furthermore, qubits fabricated above a superconducting ground plane yielded lower noise than qubits without such a layer. These results support the hypothesis that local impurities in the vicinity of the qubit wiring are a key source of low-frequency flux noise in superconducting devices.

引用

页数：4

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