Reliability and Lifetime Prediction of LED Drivers

被引:0
|
作者
Zhang, Hui [1 ]
机构
[1] SUNY Coll Oswego, Elect & Comp Engn Dept, Oswego, NY 13126 USA
关键词
D O I
暂无
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
LED drivers are critical components in LED luminaires, which power and control LEDs to deliver light as desired. They are also the weakest links inside LED luminaires so that their lifetime can greatly affect the useful life of the whole system. Therefore, the study on the reliability and lifetime of LED drivers is of great theoretical significance and practical value. This paper presented two methods to predict the reliability and lifetime of LED drivers. One method is an improved part stress analysis method based on MIL-HDBK-217F without the need of conducting reliability testing, the other is an experiment-based method using accelerated life testing. The paper also applied both of the methods to predict the lifetime of the same quasi-flyback LED driver. The temperature-dependent lifetime results are demonstrated in the paper, and a good match between the two sets of results was observed. This indicates the improved part stress analysis method presented in this work is an effective way to predict the reliability and lifetime of LED drivers. Also, the method is especially suitable for the reliability and lifetime research in the course of designing and developing LED luminaires because it does not require reliability testing which is typical expensive and time-consuming.
引用
收藏
页码:24 / 27
页数:4
相关论文
共 50 条
  • [21] A Systematic Approach for Reliability Assessment of Electrolytic Capacitor-Free LED Drivers
    Sun, Bo
    Fan, Xuejun
    van Driel, Willem
    Zhang, Guoqi
    2016 17TH INTERNATIONAL CONFERENCE ON THERMAL, MECHANICAL AND MULTI-PHYSICS SIMULATION AND EXPERIMENTS IN MICROELECTRONICS AND MICROSYSTEMS (EUROSIME), 2016,
  • [22] Rapid reliability evaluation method of LED based on pseudo-failure lifetime
    Guo, W.-L. (guoweiling@bjut.edu.cn), 1600, Editorial Office of Chinese Optics (34):
  • [23] Reliability Model Development for Photovoltaic Connector Lifetime Prediction Capabilities
    Yang, Benjamin B.
    Sorensen, N. Robert
    Burton, Patrick D.
    Taylor, Jason M.
    Kilgo, Alice C.
    Robinson, David G.
    Granata, Jennifer E.
    2013 IEEE 39TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), 2013, : 139 - 144
  • [24] Prediction of reliability and residual lifetime of the parts with a long service period
    Kostenko, N.A.
    Levkovich, T.I.
    Kostenko, P.V.
    Bulanova, E.V.
    Avtomobil'naya Promyshlennost, 66 (62): : 59 - 65
  • [25] Prediction of reliability and remaining lifetime for long-service parts
    Kostenko, NA
    Levkovich, TI
    Kostenko, PV
    Bulanova, EV
    INDUSTRIAL LABORATORY, 1997, 63 (06): : 379 - 384
  • [26] Interface reliability and lifetime prediction of heavy aluminum wire bonds
    Czerny, B.
    Khatibi, G.
    MICROELECTRONICS RELIABILITY, 2016, 58 : 65 - 72
  • [28] Data pool structural integrity - Reliability of lifetime prediction methods
    Kotte, KL
    Eulitz, KG
    MATERIALWISSENSCHAFT UND WERKSTOFFTECHNIK, 2003, 34 (09) : 836 - 842
  • [29] An Enhanced Model for Reliability Prediction of a Supercapacitor's Lifetime Developing an Improved Reliability Model
    Radej, Blaz
    Beges, Gaber
    IEEE INDUSTRIAL ELECTRONICS MAGAZINE, 2019, 13 (03) : 26 - 34
  • [30] Accelerated Lifetime Test for Isolated Components in Linear Drivers of High-Voltage LED System
    Sun, Bo
    Koh, Sau Wee
    Yuan, Cadmus
    Fan, Xuejun
    Zhang, Guoqi
    2013 14TH INTERNATIONAL CONFERENCE ON THERMAL, MECHANICAL AND MULTI-PHYSICS SIMULATION AND EXPERIMENTS IN MICROELECTRONICS AND MICROSYSTEMS (EUROSIME), 2013,