A 1V phase locked loop with leakage compensation in 0.13 μm CMOS technology

被引:6
作者
Chuang, CN [1 ]
Liu, SI
机构
[1] Natl Taiwan Univ, Grad Inst Elect Engn, Taipei 10617, Taiwan
[2] Natl Taiwan Univ, Dept Elect Engn, Taipei 10617, Taiwan
来源
IEICE TRANSACTIONS ON ELECTRONICS | 2006年 / E89C卷 / 03期
关键词
phase frequency detector; charge pump; loop filter; divider; VCO;
D O I
10.1093/ietele/e89-c.3.295
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In deep sub-micrometer CMOS process, owing to the thin gate oxide and small subthreshold voltage, the leakage current becomes more and more serious. The leakage current has made the impact on phase-locked loops (PLLs). In this paper, the compensation circuits are presented to reduce the leakage current on the charge pump circuit and the MOS capacitor as the loop filter. The proposed circuit has been fabricated in 0.13-mu m CMOS process. The power consumption is 3 mW and the die area is 0.27 x 0.3 mm(2).
引用
收藏
页码:295 / 299
页数:5
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