CELLO photo-impedance-spectroscopy on PERC solar cells: Separation of bulk and rear surface defects

被引：1

作者：

Schuett, Andreas ^{[1
]}

机构：

[1] CELLOscan GbR, Gravelottestr 5, D-24116 Kiel, Germany

来源：

7TH INTERNATIONAL CONFERENCE ON SILICON PHOTOVOLTAICS, SILICONPV 2017 | 2017年 / 124卷

关键词：

bulk lifetime; rear surface recombination velocity; gettering; degradation; series resistance;

D O I：

10.1016/j.egypro.2017.09.318

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

Thin PERC type solar cells are wait in the wings to take over from Al-BSF solar cells. However, the impact of (bulk) material and rear surface (contact) quality to the efficiency is found to be quite hard to measure on a processed solar cell. We will show with this paper that CELLO (solar cell local characterization) photo-impedance-spectroscopy measurements are capable of separating bulk from rear side effects on locally resolved maps. This allows cell manufacturers to better understand, analyze and control processing parameters and related defects like parasitic shunting, rear contact formation and passivation, gettering and other forms of degradation. As a result cell efficiencies and revenues can be boosted. (C) 2017 The Authors. Published by Elsevier Ltd.

引用

页码：161 / 165

页数：5