Improved Thermal Stability of Green InGaN/GaN Multiple-Quantum-Well Light-Emitting Diodes with an AlGaN/GaN Short-Superlattice-Inserted Structure

被引:2
|
作者
Lee, Y. S. [1 ]
Kumar, M. Senthil
Cuong, T. V.
Park, J. Y.
Ryu, J. H.
Chung, S. J.
Hong, C. -H.
Suh, E. -K.
机构
[1] Chonbuk Natl Univ, Semicond Phys Res Ctr, Jeonju 561756, South Korea
关键词
InGaN/GaN light-emitting diodes (LEDs); Short superlattice (SSL); Thermal transient test; Thermal resistance; PATTERNED SAPPHIRE; HIGH-POWER; GAN; LEDS;
D O I
10.3938/jkps.54.140
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We report an amelioration of the electrical, thermal and optical performances of green InGaN/GaN multiple-quantum-well light-emitting diodes (LEDs) with AlGaN/GaN short-superlattice (SSL)-inserted structure grown using metal-organic chemical vapor deposition. According to an atomic force microscopic study, the GaN template with the SSL-inserted structure shows a significant reduction in pit density compared to the conventionally-grown template. The insertion of the SSL is also found to alleviate the effect of threading dislocations on the degradation of the electrical performance and promotes the stability of the K-factor and a low thermal resistance under a long-term acceleration test. A relatively higher optical output power is obtained for SSL-inserted InGaN/GaN green LEDs at high injection currents.
引用
收藏
页码:140 / 144
页数:5
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