Fabrication of X-Ray Gratings Using X-Ray Lithography Technique for X-Ray Talbot Interferometer

被引:9
作者
Noda, Daiji
Tsujii, Hiroshi
Takahashi, Naoki
Hattori, Tadashi
机构
[1] Laboratory of Advanced Science and Technology for Industry, University of Hyogo
基金
日本科学技术振兴机构;
关键词
LARGE-AREA;
D O I
10.1149/1.3082377
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
The X-ray radiographic imaging technique is very important in medical, biological, inspection, material science, and other fields. However, it is not enough to obtain a clear X-ray image of samples with low absorbance materials, such as biological soft tissues. Then, we have used an X-ray phase-imaging method of an X-ray Talbot interferometer. In this method, X-ray gratings were required to have a narrow pitch and high aspect ratio structure. Therefore, we have developed and fabricated high-aspect-ratio X-ray gratings with a pitch of 5.3 mu m, a height of 30 mu m, and a large effective area of 100 X 100 mm using X-ray lithography and narrow electroforming techniques. In this paper, we discuss the fabrication process of X-ray gratings with a narrow pitch and high-aspect-ratio structure, and results of X-ray phase tomography using an X-ray Talbot interferometer with these X-ray gratings. (C) 2009 The Electrochemical Society. [DOI: 10.1149/1.3082377] All rights reserved.
引用
收藏
页码:H299 / H302
页数:4
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