Nanoscale crystal grain characterization via linear polarization X-ray ptychography

被引：14

作者：

Gao, Zirui ^{[1
,2
]}

Holler, Mirko ^{[1
]}

Odstrcil, Michal ^{[1
]}

Menzel, Andreas ^{[1
]}

Guizar-Sicairos, Manuel ^{[1
]}

Ihli, Johannes ^{[1
]}

机构：

[1] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

[2] Swiss Fed Inst Technol, Dept Informat Technol & Elect Engn, CH-8093 Zurich, Switzerland

来源：

CHEMICAL COMMUNICATIONS | 2020年 / 56卷 / 87期

基金：

瑞士国家科学基金会;

关键词：

DICHROISM; MORPHOLOGY;

D O I：

10.1039/d0cc06101h

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

X-ray linear dichroism and X-ray birefringence microscopy are yet to be fully utilized as instruments in the microstructural characterization of crystalline materials. Here, we demonstrate analyser-free X-ray linear dichroism microscopy using spectroscopic hard X-ray ptychography. First experiments enabled a spectroscopic and microstructural characterisation of polycrystalline vanadium pentoxide on the nanoscale, outside of diffraction-contrast based methods.

引用

页码：13373 / 13376

页数：4

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